Toward Construction of Measurement/Characterization Platform for Open Innovation von Ichimura, Shingo

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Current activities of ISO TC229/WG2 on purity evaluation and quality assurance standards for carbon nanotubes von Ichimura, Shingo

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Component analysis of a mixed beam generated by vacuum electrospray of an ionic liquid von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Ichimura, Shingo

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Tip characterizer for atomic force microscopy von Itoh, Hiroshi, Fujimoto, Toshiyuki, Ichimura, Shingo

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Global standardization of scanning probe microscopy von Fujita, Daisuke, Itoh, Hiroshi, Ichimura, Shingo, Kurosawa, Tomizo

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Characteristics of a charged-droplet beam generated by vacuum electrospray of an ionic liquid von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Nakanaga, Taisuke, Ichimura, Shingo

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Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquid von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Ichimura, Shingo

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Independence Availability of Measurement Data for Effective Use of Measurement Results von FUJIMOTO, Toshiyuki, SHIRONO, Katsuhiro, ICHIMURA, Shingo

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Dissociative ionization of a large molecule studied by intense phase-controlled laser fields von Ohmura, Hideki, Saito, Naoaki, Nonaka, Hidehiko, Ichimura, Shingo

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Beam Characteristics of Positively and Negatively Charged Droplets Generated by Vacuum Electrospray of an Ionic Liquid von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Ichimura, Shingo

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A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Nakanaga, Taisuke, Ichimura, Shingo

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Beam Characteristics of Positively and Negatively Charged Droplets Generated by Vacuum Electrospray of an Ionic Liquid von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Ichimura, Shingo

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Reaction analysis of initial oxidation of silicon by UV-light-excited ozone and the application to rapid and uniform SiO2 film growth von Tosaka, Aki, Nonaka, Hidehiko, Ichimura, Shingo, Nishiguchi, Tetsuya

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High-quality SiO2 film formation by highly concentrated ozone gas at below 600 °C von Nishiguchi, Tetsuya, Nonaka, Hidehiko, Ichimura, Shingo, Morikawa, Yoshiki, Kekura, Mitsuru, Miyamoto, Masaharu

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Creating a Measurement Analysis Platform for DX Promotion: CPS type complex measurement analysis and common data format concept von Ichimura, Shingo

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Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) using the metal-cluster-complex primary ion of Ir4(CO)7 von Fujiwara, Yukio, Saito, Naoaki, Nonaka, Hidehiko, Suzuki, Atsushi, Nakanaga, Taisuke, Fujimoto, Toshiyuki, Kurokawa, Akira, Ichimura, Shingo

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Current activities of ISO TC229/WG2 on purity evaluation and quality assurance standards for carbon nanotubes : Chemical characterization of engineered nanoparticles von ICHIMURA, Shingo

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Metal cluster complex primary ion beam source for secondary ion mass spectrometry (SIMS) von Fujiwara, Yukio, Watanabe, Kouji, Nonaka, Hidehiko, Saito, Naoaki, Suzuki, Atsushi, Fujimoto, Toshiyuki, Kurokawa, Akira, Ichimura, Shingo

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Low-Temperature Oxidation of Silicon using UV-Light-Excited Ozone von Tosaka, Aki, Nishiguchi, Tetsuya, Nonaka, Hidehiko, Ichimura, Shingo

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Standardization of Measurement and Characterization for Nanotechnology: Recent Trend and Roadmap von ICHIMURA, Shingo

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