Strongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Arn+ (n ≤ 2200) cluster ion bombardment von Gnaser, Hubert, Ichiki, Kazuya, Matsuo, Jiro

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Sputtered ion emission under size-selected Arn+ cluster ion bombardment von Gnaser, Hubert, Ichiki, Kazuya, Matsuo, Jiro

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What size of cluster is most appropriate for SIMS? von Matsuo, Jiro, Ninomiya, Satoshi, Nakata, Yoshihiko, Honda, Yoshiro, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki

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Characterization of vapor-deposited l-leucine nanofilm von Hada, Masaki, Ichiki, Kazuya, Matsuo, Jiro

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MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions von Yamada, Hideaki, Ichiki, Kazuya, Nakata, Yoshihiko, Ninomiya, Satoshi, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Size effect in cluster collision on solid surfaces von Matsuo, Jiro, Ninomiya, Satoshi, Nakata, Yoshihiko, Ichiki, Kazuya, Aoki, Takaaki, Seki, Toshio

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The effect of incident cluster ion energy and size on secondary ion yields emitted from Si von Ninomiya, Satoshi, Ichiki, Kazuya, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Wafer Scale Insulation of High Aspect Ratio Through-Silicon Vias by iCVD von Jousseaume, Vincent, Guerin, Chloe, Ichiki, Kazuya, Lagrange, Mélanie, Altemus, Bruce, Zavvou, Chara, Veillerot, Marc, Mourier, Thierry, Faguet, Jacques

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Feasibility study into the deposition of an organic planarization layer using sequential polymerization initiated chemical vapor deposition von Ichiki, Kazuya, Altemus, Bruce, Gildea, Adam, Faguet, Jacques

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Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams von Ninomiya, Satoshi, Ichiki, Kazuya, Yamada, Hideaki, Nakata, Yoshihiko, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Long-term smoking impairs platelet-derived nitric oxide release von ICHIKI, K, IKEDA, H, HARMAKI, N, UENO, T, IMAIZUMI, T

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Platelet-Derived Nitric Oxide and Coronary Risk Factors von Ikeda, Hisao, Takajo, Yoshinori, Murohara, Toyoaki, Ichiki, Kazuya, Adachi, Hisashi, Haramaki, Nobuya, Katoh, Atsushi, Imaizumi, Tsutomu

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Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions von Ninomiya, Satoshi, Nakata, Yoshihiko, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Evaluation of damage depth on arginine films with molecular depth profiling by Ar cluster ion beam von Yamamoto, Yasuyuki, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Sputtering Properties of Si by Size-Selected Ar Gas Cluster Ion Beam von Ichiki, Kazuya, Ninomiya, Satoshi, Sekia, Toshio, Aoki, Takaaki, Matsuo, Jiro

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A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions von Ninomiya, Satoshi, Nakata, Yoshihiko, Honda, Yoshiro, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Strongly reduced fragmentation and soft emission processes in sputtered ion formation from amino acid films under large Ar n + ( n ≤ 2200) cluster ion bombardment von Gnaser, Hubert, Ichiki, Kazuya, Matsuo, Jiro

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Ion-induced damage evaluation with Ar cluster ion beams von Yamamoto, Yasuyuki, Ichiki, Kazuya, Seki, Toshio, Aoki, Takaaki, Matsuo, Jiro

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Sputtered ion emission under size‐selected Ar n + cluster ion bombardment von Gnaser, Hubert, Ichiki, Kazuya, Matsuo, Jiro

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