Reducing the contact time of a bouncing drop von Bird, James C., Dhiman, Rajeev, Kwon, Hyuk-Min, Varanasi, Kripa K.

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Increasing Leidenfrost point using micro-nano hierarchical surface structures von Kwon, Hyuk-min, Bird, James C., Varanasi, Kripa K.

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Hydrophobicity of rare-earth oxide ceramics von Azimi, Gisele, Dhiman, Rajeev, Kwon, Hyuk-Min, Paxson, Adam T., Varanasi, Kripa K.

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Zinc oxide and indium-gallium-zinc-oxide bi-layer synaptic device with highly linear long-term potentiation and depression characteristics von Choi, Hyun-Woong, Song, Ki-Woo, Kim, Seong-Hyun, Nguyen, Kim Thanh, Eadi, Sunil Babu, Kwon, Hyuk-Min, Lee, Hi-Deok

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Comparison of Structural Integrity and Functional Outcome Between Delaminated and Nondelaminated Rotator Cuff Tears After En Masse Arthroscopic Repair: A Retrospective Cohort Study... von Kim, Young-Kyu, Jung, Kyu-Hak, Kwon, Hyuk-Min

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Impact of Charge-Trapping Effects on Reliability Instability in AlxGa1−xN/GaN High-Electron-Mobility Transistors with Various Al Compositions von Amir, Walid, Chakraborty, Surajit, Kwon, Hyuk-Min, Kim, Tae-Woo

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Effects of thermal annealing on analog resistive switching behavior in bilayer HfO2/ZnO synaptic devices: the role of ZnO grain boundaries von Yeong-Jin, An, Han, Yan, Chae-min Yeom, Jun-kyo Jeong, Sunil Babu Eadi, Lee, Hi-Deok, Hyuk-Min Kwon

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Effect of high-pressure D2 and H2 annealing on LFN properties in FD-SOI pTFET von Shin, Hyun-Jin, Eadi, Sunil Babu, An, Yeong-Jin, Ryu, Tae-Gyu, Kim, Do-woo, Lee, Hi-Deok, Kwon, Hyuk-Min

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Hybrid factors influencing wet grip and rolling resistance properties of solution styrene‐butadiene rubber composites von Choi, Sung‐Seen, Kwon, Hyuk‐Min, Kim, Yeowool, Ko, Eunah, Lee, Ki‐Suk

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Thermocapillary motion on lubricant-impregnated surfaces von Bjelobrk, Nada, Girard, Henri-Louis, Bengaluru Subramanyam, Srinivas, Kwon, Hyuk-Min, Quéré, David, Varanasi, Kripa K.

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Impact of fast and slow transient charging effect on reliability instability in In0.7Ga0.3As quantum-well MOSFETs with high-κ dielectrics von Kwon, Hyuk-Min, Kim, Dae-Hyun, Kim, Tae-Woo

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Explicit Thermal Resistance Model of Self-Heating Effects of AlGaN/GaN HEMTs with Linear and Non-Linear Thermal Conductivity von Chakraborty, Surajit, Amir, Walid, Shin, Ju-Won, Shin, Ki-Yong, Cho, Chu-Young, Kim, Jae-Moo, Hoshi, Takuya, Tsutsumi, Takuya, Sugiyama, Hiroki, Matsuzaki, Hideaki, Kwon, Hyuk-Min, Kim, Dae-Hyun, Kim, Tae-Woo

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New Methodology for Parasitic Resistance Extraction and Capacitance Correction in RF AlGaN/GaN High Electron Mobility Transistors von Chakraborty, Surajit, Amir, Walid, Kwon, Hyuk-Min, Kim, Tae-Woo

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Effect of Trap Behavior on the Reliability Instability of Metamorphic Buffer in InAlAs/InGaAs MHEMT on GaAs von Shin, Ki-Yong, Shin, Ju-Won, Amir, Walid, Chakraborty, Surajit, Shim, Jae-Phil, Lee, Sang-Tae, Jang, Hyunchul, Shin, Chan-Soo, Kwon, Hyuk-Min, Kim, Tae-Woo

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Analytical considerations for determination of the microstructures of sulfur‐cured solution styrene − butadiene rubbers von Choi, Sung‐Seen, Kim, Yeowool, Kwon, Hyuk‐Min

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Damage free Ar ion plasma surface treatment on In0.53Ga0.47As-on-silicon metal-oxide-semiconductor device von Koh, Donghyi, Shin, Seung Heon, Ahn, Jaehyun, Sonde, Sushant, Kwon, Hyuk-Min, Orzali, Tommaso, Kim, Dae-Hyun, Kim, Tae-Woo, Banerjee, Sanjay K.

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Correlation between low-frequency noise and interface traps of fully-depleted silicon-on-insulator tunneling FETs induced by hot carrier stress von Shin, Hyun-Jin, Song, Hyun-Dong, Song, Hyeong-Sub, Eadi, Sunil Babu, Choi, Hyun-Woong, Kim, Seong-Hyun, Kim, Do-Woo, Lee, Hi-Deok, Kwon, Hyuk-Min

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A Study on Dominant Mechanism and Analytical Model of Low-Frequency Noise in FD-SOI pTFET von Shin, Hyun-Jin, Eadi, Sunil Babu, Kim, Seong-Hyun, Ryu, Tae-Gyu, An, Yeong-Jin, Kim, Do-Woo, Lee, Hi-Deok, Kwon, Hyuk-Min

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Ventilation Rate and Thermal Environment Properties of Double Skin Façade Considering Wind Profile and Direction von Kim, Geum-Hee, Kwon, Hyuk-Min, Yang, Jeong-Hoon

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A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor von Hyuk-Min Kwon, Sung-Kyu Kwon, Kwang-Seok Jeong, Sung-Kwen Oh, Sun-Ho Oh, Woon-Il Choi, Tae-Woo Kim, Dae-Hyun Kim, Chang-Yong Kang, Byoung Hun Lee, Kirsch, Paul, Hi-Deok Lee

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