A geometrical optics polarimetric bidirectional reflectance distribution function for dielectric and metallic surfaces von Hyde, 4th, M W, Schmidt, J D, Havrilla, M J

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Producing any desired far-field mean irradiance pattern using a partially-coherent Schell-model source von Hyde IV, M W, Basu, S, Xiao, X, Voelz, D G

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Synthesis of non-uniformly correlated partially coherent sources using a deformable mirror von Hyde, M. W., Bose-Pillai, S. R., Wood, R. A.

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A clamped dual-ridged waveguide measurement system for the broadband, nondestructive characterization of sheet materials von Hyde IV, M. W., Havrilla, M. J.

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A novel and simple technique for measuring low-loss materials using the two flanged waveguides measurement geometry von Hyde, M W, Havrilla, M J, Bogle, A E

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A fast and efficient method for producing partially coherent sources von Hyde IV, M W, Bose-Pillai, S, Xiao, X, Voelz, D G

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Twisted Spatiotemporal Optical Vortex Random Fields von Hyde, Milo

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A NONDESTRUCTIVE TECHNIQUE FOR DETERMINING COMPLEX PERMITTIVITY AND PERMEABILITY OF MAGNETIC SHEET MATERIALS USING TWO FLANGED RECTANGULAR WAVEGUIDES von Hyde IV, Milo Wilt, Havrilla, Michael J.

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NONDESTRUCTIVE COMPLEX PERMITTIVITY AND PERMEABILITY EXTRACTION USING A TWO-LAYER DUAL-WAVEGUIDE PROBE MEASUREMENT GEOMETRY von Seal, M.D, Hyde, M.W, Havrilla, M.J

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Nondestructive Material Characterization of a Free-Space-Backed Magnetic Material Using a Dual-Waveguide Probe von Hyde, M. W., Havrilla, M. J., Bogle, A. E., Rothwell, E. J.

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A Novel Method for Determining the R-Card Sheet Impedance Using the Transmission Coefficient Measured in Free-Space or Waveguide Systems von Hyde, M.W., Havrilla, M.J., Crittenden, P.E.

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ERROR ANALYSIS OF A TWO-LAYER METHOD FOR THE ELECTROMAGNETIC CHARACTERIZATION OF CONDUCTOR-BACKED ABSORBING MATERIAL USING AN OPEN-ENDED WAVEGUIDE PROBE von Dester, Gary Dean, Rothwell, Edward J., Havrilla, Michael J., Hyde IV, Milo Wilt

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Comparison of branch point tolerant wavefront reconstructors in the presence of simulated noise effects von Steinbock, M. J., Schmidt, J. D., Hyde, M. W.

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Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry von Hyde, M W, Havrilla, M J

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Sensitivity of dual waveguide probe complex permittivity and permeability measurement to probe lift-off error von Havrilla, M.J., Hyde, M.W.

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Design of an open-ended coaxial probe for broadband, low-footprint nondestructive characterization of PEC-backed materials von Hyde, M. W., Havrilla, M. J.

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Dyadic Green Function of an Imperfectly-Conducting Dual Waveguide Probe von Havrilla, M.J., Hyde, M.W.

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Electromagnetic material characterization of conductor- backed media using a NDE microstrip probe von Havrilla, M. J., Bogle, A. E., Hyde, M. W., Rothwell, E. J.

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Importance and vulnerability of the world’s water towers von Immerzeel, W. W., Lutz, A. F., Andrade, M., Bahl, A., Biemans, H., Bolch, T., Hyde, S., Brumby, S., Davies, B. J., Elmore, A. C., Emmer, A., Feng, M., Fernández, A., Haritashya, U., Kargel, J. S., Koppes, M., Kraaijenbrink, P. D. A., Kulkarni, A. V., Mayewski, P. A., Nepal, S., Pacheco, P., Painter, T. H., Pellicciotti, F., Rajaram, H., Rupper, S., Sinisalo, A., Shrestha, A. B., Viviroli, D., Wada, Y., Xiao, C., Yao, T., Baillie, J. E. M.

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An evaluation of ocean color model estimates of marine primary productivity in coastal and pelagic regions across the globe von Saba, V. S., Friedrichs, M. A. M., Antoine, D., Armstrong, R. A., Asanuma, I., Behrenfeld, M. J., Ciotti, A. M., Dowell, M., Hoepffner, N., Hyde, K. J. W., Ishizaka, J., Kameda, T., Marra, J., Mélin, F., Morel, A., O'Reilly, J., Scardi, M., Smith, W. O., Smyth, T. J., Tang, S., Uitz, J., Waters, K., Westberry, T. K.

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