Ultralow Capacitance Transient Voltage Suppressor Design von Lo, Kuo-Hsuan, Huang, Chien-Hao, Weng, Wu-Te, Huang, Tsung-Yi, Su, Hung-Der, Gong, Jeng, Huang, Chih-Fang

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Improving the Electrostatic Discharge Robustness of a Junction Barrier Schottky Diode Using an Embedded p-n-p BJT von Chung-Yu Hung, Tzu-Cheng Kao, Jian-Hsing Lee, Jeng Gong, Kuo-Hsuan Lo, Hung-Der Su, Chih-Fang Haung

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Simple scheme to increase hold voltage for silicon-controlled rectifier von Hung, Chung-Yu, Kao, Tzu-Cheng, Lee, Jian-Hsing, Gong, Jeng, Huang, Tsung-Yi, Su, Hung-Der, Chang, Kuo-Cheng, Huang, Chih-Fang, Lo, Kuo-Hsuan

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Failure mechanism for input buffer under CDM test von Kao, Tzu-Cheng, Hung, Chung-Yu, Lee, Jian-Hsing, Lien, Chen-Hsin, Chiu, Chien-Wei, Lo, Kuo-Hsuan, Su, Hung-Der, Weng, Wu-Te

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Semiself-Protection Scheme for Gigahertz High-Frequency Output ESD Protection von LEE, Jian-Hsing, HUANG, Shao-Chang, SU, Hung-Der, CHEN, Ke-Horng

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The influence of the layout on the ESD performance of HV-LDMOS von Jian-Hsing Lee, Hung-Der Su, Chien-Ling Chan, Yang, D, Chen, J F, Wu, K M

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The ESD failure mechanism of ultra-HV 700V LDMOS von Jian-Hsing Lee, Tzu-Cheng Kao, Chien-Liang Chan, Jin-Lian Su, Hung-Der Su, Kuo-Cheng Chang

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Evaluating the CDM-Robustness of the input buffer with very fast transmission line pulse von Kao, Tzu-Cheng, Lee, Jian-Hsing, Hung, Chung-Yu, Lien, Chen-Hsin, Su, Hung-Der

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Using LV process to design high voltage DDDMOSFET and LDMOSFET with 3-D profile structure von Chien-Hao Huang, Tsung-Yi Huang, Ching-Yao Yang, Huang-Ping Chu, Kuo-Hsuan Lo, Chung-Yu Hung, Kuo-Cheng Chang, Hung-Der Su, Chih-Fang Huang, Jeng Gong

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A floating well method for exact capacitance-voltage measurement of nano technology von Hung-Der Su, Bi-Shiou Chiou, Shien-Yang Wu, Ming-Hsung Chang, Kuo-Hua Lee, Yung-Shun Chen, Chih-Ping Chao, Yee-Chaung See, Sun, J.Y.-C.

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Characteristics of Oxide Breakdown and Related Impact on Device of Ultrathin (2.2 nm) Silicon Dioxide von Su, Hung-Der, Chiou, Bi-Shiou, Wu, Shien-Yang, Chang, Ming-Hsung, Lee, Kuo-Hua, Chen, Yung-Shun, Chao, Chih-Ping, See, Yee-Chaung, Sun, Jack Yuan-Chen

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Bi-Mode Breakdown Test Methodology of Ultrathin Oxide von Su, Hung-Der, Chiou, Bi-Shiou, Ko, Chin-Yuan, Wu, Shien-Yang, Chang, Ming-Hsung, Lee, Kuo-Hua, Chen, Yung-Shun, Chao, Chih-Ping, See, Yee-Chaung, Sun, Jack Yuan-Chen

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Novel Chip Standby Current Prediction Model and Ultrathin Gate Oxide Scaling Limit von Su, Hung-Der, Chiou, Bi-Shiou, Lu, Ping-Chiang, Chang, Ming-Hsung, Lee, Kuo-Hua, Chao, Chih-Ping, See, Yee-Chaung, Sun, Jack Yuan-Chen

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Leakage current blocking circuit and leakage current blocking method for decoupling capacitor von Su, Hung-Der

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Bio-detection device and manufacturing method thereof von Chang, Chun-Hao, Qian, Da-Hong, Wu, Min-Da, Yang, Yu-Lin, Su, Hung-Der

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FinFET with discontinuous channel regions von SU, HUNG-DER

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LEAKAGE CURRENT BLOCKING CIRCUIT AND LEAKAGE CURRENT BLOCKING METHOD FOR DECOUPLING CAPACITOR von SU, HUNG-DER

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BIO-DETECTION DEVICE AND MANUFACTURING METHOD THEREOF von Chang, Chun-Hao, Qian, Da-Hong, Wu, Min-Da, Yang, Yu-Lin, Su, Hung-Der

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Bio-detection device and manufacturing method thereof von Chang, Chun-Hao, Qian, Da-Hong, Wu, Min-Da, Yang, Yu-Lin, Su, Hung-Der

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BIO-DETECTION DEVICE AND MANUFACTURING METHOD THEREOF von Chang, Chun-Hao, Qian, Da-Hong, Wu, Min-Da, Yang, Yu-Lin, Su, Hung-Der

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