Time resolved retardation and orientation measurement by common path heterodyne interferometer von Lang, Kuo-Chen, Teng, Hui-Kang

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Interferometric measurement of temporal behavior of linear birefringence with extended range von Lang, Kuo-Chen, Teng, Hui-Kang

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Optical balanced detection in heterodyne interferometric ellipsometry von Lang, Kuo-Chen, Teng, Hui-Kang

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Polarization modulation imaging ellipsometry for thin film thickness measurement von Chou, Chien, Teng, Hui-Kang, Yu, Chih-Jen, Huang, Hong-Sheng

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Carrier-suppressed modulation and self-mixing demodulation for vibration measurement von Lang, Kuo-Chen, Teng, Hung-Jin, Teng, Hui-Kang

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Determination of linear displacement by envelope detection with maximum likelihood estimation von Lang, Kuo-Chen, Teng, Hui-Kang

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Heterodyne interferometer for displacement measurement with amplitude quadrature and noise suppression von Teng, Hui-Kang, Lang, Kuo-Chen

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Dark fringe operation and noise reduction with optical subtraction approach and power allocation von Teng, Hui-Kang, Lang, Kuo-Chen

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Polarization-shifting interferometry on two-dimensional linear birefringent parameters measurement von Teng, Hui-Kang, Chou, Chien, Chang, Hsiu-Fong

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Excess noise reduction by optical technique in amplitude-sensitive heterodyne interferometer for small differential phase detection von Teng, Hui-Kang, Lang, Kuo-Chen

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Double Sideband Suppressed Carrier Performance with Optical Balanced Detection von Lang, Kuo Chen, Teng, Hui Kang

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Simultaneous Measurement of Phase Retardation and Fast-Axis Angle of Phase Retardation Plate von Kuo, Wen-Chuan, Liao, Kuo-Yu, Jan, Gwo-Jen, Teng, Hui-Kang, Chou, Chien

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Balanced detector interferometric ellipsometer von CHOU, Chien, TENG, Hui-Kang, TSAI, Chien-Chung, YU, Li-Ping

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Differential phase decoder in a polarized optical heterodyne interferometer von CHOU, Chien, TENG, Hui-Kang, TSAI, Chien-Chung, WU, Jheng-Syong

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Polarization shifting interferometric profilometer von Teng, Hui-Kang, Lang, Kuo-Chen

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Dual-frequency paired polarization phase shifting ellipsometer von Yu, Chih-Jen, Lin, Chu-En, Teng, Hui-Kang, Tsai, Chien-Chung, Chou, Chien

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Two-Dimensional Linear Birefringence Vector Measurement by Polarization-Stepping Interferometer von Lang, Kuo-Chen, Teng, Hui-Kang, Chang, Hsiu-Fong, Han, Chien-Yuan, Chou, Chien

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Polarized Ring Interferometer for Linear Birefringence Measurement von Lang, Kuo-Chen, Chou, Chien, Teng, Hui-Kang

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A mesh network reliability analysis using reliability block diagram von Cheng-Min Lin, Hui-Kang Teng, Cheng-Chih Yang, Hwei-Li Weng, Ming-Cheng Chung, Chiu-Chiao Chung

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A phase sensitive optical rotation measurement in a scattered chiral medium using a Zeeman laser von Chou, Chien, Kuo, Wen-Chuan, Hsieh, Tung-Sheng, Teng, Hui-Kang

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