Electrical TCAD Study of the Low-Voltage Avalanche-Mode Superjunction LED von Hueting, R. J. E., de Vries, H., Dutta, S., Annema, A. J.

Volltext

Ruggedness of Silicon Power MOSFETs-Part II: Device Design Failures and Modeling: A Review von Tambone, R., Ferrara, A., Siemieniec, R., Wood, A., Magrini, F., Hueting, R. J. E.

Volltext

Ruggedness of Silicon Power MOSFETs-Part I: Cell Structure Design Related Failure: A Review von Tambone, R., Ferrara, A., Siemieniec, R., Wood, A., Magrini, F., Hueting, R. J. E.

Volltext

Electrostatic analysis of n-doped SrTiO3 metal-insulator-semiconductor systems von Kamerbeek, A. M., Banerjee, T., Hueting, R. J. E.

Volltext

Ion-Sensitive Gated Bipolar Transistor von Hueting, R. J. E., Vincent, S. E. J., Bomer, J. G., Sanders, R. G. P., Olthuis, W.

Volltext

On the Trade-Off Between Quality Factor and Tuning Ratio in Tunable High-Frequency Capacitors von Tiggelman, M.P.J., Reimann, K., Van Rijs, F., Schmitz, J., Hueting, R.J.E.

Volltext

Strain characterization of FinFETs using Raman spectroscopy von Kaleli, B., van Hemert, T., Hueting, R.J.E., Wolters, R.A.M.

Volltext

Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode von Kaleli, B., Nguyen, M.D., Schmitz, J., Wolters, R.A.M., Hueting, R.J.E.

Volltext

Physics-based stability analysis of MOS transistors von Ferrara, A., Steeneken, P.G., Boksteen, B.K., Heringa, A., Scholten, A.J., Schmitz, J., Hueting, R.J.E.

Volltext

Strain and Conduction-Band Offset in Narrow n-type FinFETs von van Hemert, T., Kaleli, B., Hueting, R. J. E., Esseni, D., van Dal, M. J. H., Schmitz, J.

Volltext

BaxSr1-xTi1.02O3 metal-insulator-metal capacitors on planarized alumina substrates von TIGGELMAN, M. P. J, REIMANN, K, KLEE, M, MAUCZOCK, R, KEUR, W, HUETING, RJ. E

Volltext

Optimized reflector stacks for solidly mounted bulk acoustic wave resonators von Jose, S, Jansman, A B M, Hueting, R J E, Schmitz, J

Volltext

Valence Band Offset Measurements on Thin Silicon-on-Insulator MOSFETs von van der Steen, J.-L.P.J., Hueting, R.J.E., Smit, G.D.J., Hoang, T.., Holleman, J.., Schmitz, J..

Volltext

Design optimization of field-plate assisted RESURF devices von Boksteen, B. K., Ferrara, A., Heringa, A., Steeneken, P. G., Koops, G. E. J., Hueting, R. J. E.

Volltext

Exploring capacitance-voltage measurements to find the piezoelectric coefficient of aluminum nitride von van Hemert, T., Sarakiotis, D., Jose, S., Hueting, R. J. E., Schmitz, J.

Volltext

Electrostatic analysis of n-doped SrTiO{sub 3} metal-insulator-semiconductor systems von Kamerbeek, A. M., Banerjee, T., Hueting, R. J. E.

Volltext

Broad sustainability contra sustainability: the proper construction of sustainability indicators von Hueting, Roefie, Reijnders, Lucas

Volltext

Comparison of electrical techniques for temperature evaluation in power MOS transistors von Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J., Hueting, R. J. E.

Volltext

Integration of epitaxial Pb(Zr0.52Ti0.48)O3 films on GaN/AlGaN/GaN/Si(111) substrates using rutile TiO2 buffer layers von Elibol, K., Nguyen, M.D., Hueting, R.J.E., Gravesteijn, D.J., Koster, G., Rijnders, G.

Volltext

Three persistent myths in the environmental debate von Hueting, Roefie

Volltext