Thin film engineering for N@C60 quantum computers : Spin detection and device patterning approaches von SCHAEFER, Sebastian, HUEBENER, Kati, HARNEIT, Wolfgang, BOEHME, Christoph, FOSTIROPOULOS, Konstantinos, ANGERMANN, Heike, RAPPICH, Jörg, BEHRENDS, Jan, LIPS, Klaus

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Light induced degradation: kinetic model and grain boundary impact on sponge-LID von Sporleder, Kai, Hübener, Kati, Petter, Kai, Kranert, Christian, Luka, Tabea, Turek, Marko

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Low-cost Kerfless Wafers with Gradient Dopant Concentration Exceeding 19% Cell Efficiency in PERC Production Line von Jonczyk, Ralf, Lorenz, Adam, Ersen, Ali, Hofstetter, Jasmin, Hübener, Kati, Duncker, Klaus, Scharf, Jessica, Neibergall, Larissa, Petter, Kai, Müller, Jörg, Jeong, Daniel

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Thin film engineering for N@C 60 quantum computers: Spin detection and device patterning approaches von Schaefer, Sebastian, Huebener, Kati, Harneit, Wolfgang, Boehme, Christoph, Fostiropoulos, Konstantinos, Angermann, Heike, Rappich, Jörg, Behrends, Jan, Lips, Klaus

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ODMR of NV centers in nano‐diamonds covered with N@C 60 von Huebener, Kati, Schoenfeld, Rolf Simon, Kniepert, Juliane, Oelmueller, Christoph, Harneit, Wolfgang

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ODMR of NV centers in nano-diamonds covered with N@C60 von Huebener, Kati, Schoenfeld, Rolf Simon, Kniepert, Juliane, Oelmueller, Christoph, Harneit, Wolfgang

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Erratum to “Thin film engineering for N@C60 quantum computers: Spin detection and device patterning approaches” [Solid State Sciences 10 (2008) 1314–1321] von Schaefer, Sebastian, Huebener, Kati, Harneit, Wolfgang, Boehme, Christoph, Fostiropoulos, Konstantinos, Angermann, Heike, Rappich, Jörg, Behrends, Jan, Lips, Klaus

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Molekulare Spintronik mit endohedralen Fullerenen von Hübener, Kati

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