Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes von Ciou, Fong-Min, Lin, Jia-Hong, Chen, Po-Hsun, Chang, Ting-Chang, Chang, Kai-Chun, Hsu, Jui-Tse, Lin, Yu-Shan, Jin, Fu-Yuan, Hung, Wei-Chun, Yeh, Chien-Hung, Kuo, Ting-Tzu, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han

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Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETs von Ciou, Fong-Min, Hsu, Jui-Tse, Chang, Ting-Chang, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Hung, Wei-Chun, Chang, Kai-Chun, Chang, Yen-Cheng, Lin, Yun-Hsuan, Hung, Yang-Hao, Huang, Jen-Wei, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han

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Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET von Lin, Yu-Shan, Lin, Chien-Yu, Chang, Ting-Chang, Lin, Yun-Hsuan, Chang, Yen-Cheng, Chen, Kuan-Hsu, Liao, Jih-Chien, Jin, Fu-Yuan, Ciou, Fong-Min, Hung, Wei-Chun, Chang, Kai-Chun, Hung, Yang-Hao, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han

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Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node von Chang, Kai-Chun, Liao, Jih-Chien, Chang, Ting-Chang, Yeh, Chien-Hung, Lin, Chien-Yu, Jin, Fu-Yuan, Lin, Yu-Shan, Ciou, Fong-Min, Hung, Wei-Chun, Lin, Yun-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han

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Effects of the housing price to income ratio on tenure choice in Taiwan: forecasting performance of the hierarchical generalized linear model and traditional binary logistic regres... von Lee, Chun-Chang, Liang, Chih-Min, Chen, Jian-Zheng, Tung, Cheng-Huang

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Analysis of Oxide Trap Characteristics by Random Telegraph Signals in nMOSFETs With HfO2-Based Gate Dielectrics von Ching-En Chen, Ting-Chang Chang, Bo You, Jyun-Yu Tsai, Wen-Hung Lo, Szu-Han Ho, Kuan-Ju Liu, Ying-Hsin Lu, Xi-Wen Liu, Yu-Ju Hung, Tseung-Yuen Tseng, Osbert Cheng, Cheng-Tung Huang, Ching-Sen Lu

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Trap state passivation improved hot-carrier instability by zirconium-doping in hafnium oxide in a nanoscale n-metal-oxide semiconductor-field effect transistors with high-k/metal g... von Liu, Hsi-Wen, Chang, Ting-Chang, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Kuan-Ju, Lu, Ying-Hsin, Lin, Chien-Yu, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han

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Investigation of abnormal negative threshold voltage shift under positive bias stress in input/output n-channel metal-oxide-semiconductor field-effect transistors with TiN/HfO2 str... von Ho, Szu-Han, Chang, Ting-Chang, Lu, Ying-Hsin, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen

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Investigation of defect-induced abnormal body current in fin field-effect-transistors von Liu, Kuan-Ju, Chang, Ting-Chang, Chen, Ching-En, Yang, Ren-Ya, Tsai, Jyun-Yu, Lu, Ying-Hsin, Liu, Xi-Wen, Cheng, Osbert, Huang, Cheng-Tung

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Investigation of an anomalous hump in gate current after negative-bias temperature-instability in HfO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors von Ho, Szu-Han, Chang, Ting-Chang, Wu, Chi-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Guan-Ru, Chen, Hua-Mao, Lu, Ying-Shin, Wang, Bin-Wei, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Sze, Simon M.

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Impact of Mechanical Strain on GIFBE in PD SOI p-MOSFETs as Indicated From NBTI Degradation von Wen-hung Lo, Ting-Chang Chang, Chih-Hao Dai, Wan-Lin Chung, Ching-En Chen, Szu-Han Ho, Cheng, Osbert, Cheng Tung Huang

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Electron-electron scattering-induced channel hot electron injection in nanoscale n-channel metal-oxide-semiconductor field-effect-transistors with high-k/metal gate stacks von Tsai, Jyun-Yu, Chang, Ting-Chang, Chen, Ching-En, Ho, Szu-Han, Liu, Kuan-Ju, Lu, Ying-Hsin, Liu, Xi-Wen, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Lu, Ching-Sen

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Stroke-order-free on-line Chinese character recognition by stroke adjustment of two-layer bipartite weighted matching von Tung, Cheng-Huang, Jean, En-Yih

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An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO2/TiN MOSFETs von Liao, Jih-Chien, Chen, Yu-Hsuan, Lien, Chen-Hsin, Cheng, Osbert, Huang, Cheng-Tung, Ye, Yi-Han, Chang, Ting-Chang, Syong, Wei-Ren, Chang, Kai-Chun, Lu, Ying-Hsin, Liu, Hsi-Wen, Lin, Chien-Yu, Chen, Li-Hui, Jin, Fu-Yuan

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High-k shallow traps observed by charge pumping with varying discharging times von Ho, Szu-Han, Chang, Ting-Chang, Lu, Ying-Hsin, Wang, Bin-Wei, Lo, Wen-Hung, Chen, Ching-En, Tsai, Jyun-Yu, Chen, Hua-Mao, Liu, Kuan-Ju, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Chen, Tsai-Fu, Cao, Xi-Xin

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On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs von Chih-Hao Dai, Ting-Chang Chang, An-Kuo Chu, Yuan-Jui Kuo, Fu-Yen Jian, Wen-Hung Lo, Szu-Han Ho, Ching-En Chen, Wan-Lin Chung, Jou-Miao Shih, Guangrui Xia, Cheng, Osbert, Cheng-Tung Huang

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Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond von Yao-Tsung Huang, San-Lein Wu, Shoou-Jinn Chang, Chin-Kai Hung, Tzu-Juei Wang, Cheng-Wen Kuo, Cheng-Tung Huang, Cheng, Osbert

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Heuristic Algorithms for Constructing Interference-Free and Delay-Constrained Multicast Trees for Wireless Mesh Networks von Yang, Wen-Lin, Kao, Chi-Chou, Tung, Cheng-Huang

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Impact of post-metal deposition annealing temperature on performance and reliability of high-K metal-gate n-FinFETs von Lin, Chien-Yu, Chang, Ting-Chang, Liu, Kuan-Ju, Tsai, Jyun-Yu, Chen, Ching-En, Liu, Hsi-Wen, Lu, Ying-Hsin, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung

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Effects of fabrication method on defects induced by nitrogen diffusion to the hafnium oxide layer in metal–oxide–semiconductor field effect transistors von Lu, Ying-Hsin, Chang, Ting-Chang, Ho, Szu-Han, Chen, Ching-En, Tsai, Jyun-Yu, Liu, Kuan-Ju, Liu, Xi-Wen, Lin, Chien-yu, Tseng, Tseung-Yuen, Cheng, Osbert, Huang, Cheng-Tung, Yen, Wei-Ting

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