Anti-inflammatory effects of anemonin on acute ulcerative colitis via targeted regulation of protein kinase C-θ von Jiang, Lu, Chi, Chunhua, Yuan, Fang, Lu, Meiqi, Hu, Dongqing, Wang, Lin, Liu, Xiaoming

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Analysis on the Rapid Recovery of Irradiated VDMOSFETs by the Positive High Electric Field Stress von Peng, Ling, Hu, Dongqing, Jia, Yunpeng, Wu, Yu, An, Pengzhen, Jia, Guo

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SiC Planar MOSFETs With Built-In Reverse MOS-Channel Diode for Enhanced Performance von Zhou, Xintian, Gong, Hao, Jia, Yunpeng, Hu, Dongqing, Wu, Yu, Xia, Tian, Pang, Haoyang, Zhao, Yuanfu

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A Novel Split-Gate-Trench MOSFET Integrated With Normal Gate and Built-In Channel Diode von Li, Xinyu, Jia, Yunpeng, Zhou, Xintian, Zhao, Yuanfu, Wu, Yu, Hu, Dongqing, Fang, Xingyu, Deng, Zhonghan

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The Continuous Mediating Effects of GHRM on Employees’ Green Passion via Transformational Leadership and Green Creativity von Jia, Jianfeng, Liu, Huanxin, Chin, Tachia, Hu, Dongqing

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A Simulation-Based Comparison Between Si and SiC MOSFETs on Single-Event Burnout Susceptibility von Zhou, Xintian, Jia, Yunpeng, Hu, Dongqing, Wu, Yu

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Simulation study on single event burnout in linear doping buffer layer engineered power VDMOSFET von 贾云鹏 苏洪源 金锐 胡冬青 吴郁

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Role modeling effects: how leader's job involvement affects follower creativity von Hu, Dongqing, Gu, Qinxuan, Zhang, Yinxuan

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SiC Trench MOSFET With Embedded Schottky Super Barrier Rectifier for High Temperature Ruggedness von Zhou, Xintian, Zhang, Shida, Li, Mingwei, Jia, Yunpeng, Hu, Dongqing, Wu, Yu, Zhao, Yuanfu

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SiC Double-Trench MOSFETs With Embedded MOS-Channel Diode von Zhou, Xintian, Pang, Haoyang, Jia, Yunpeng, Hu, Dongqing, Wu, Yu, Tang, Yun, Xia, Tian, Gong, Hao, Zhao, Yuanfu

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Impact of Different Gate Biases on Irradiation and Annealing Responses of SiC MOSFETs von Hu, Dongqing, Zhang, Jingwei, Jia, Yunpeng, Wu, Yu, Peng, Ling, Tang, Yun

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Simulation study on single-event burnout of 550 V double RESURF SOI Lateral IGBT von Zhao, Chongning, Hu, Dongqing, Zheng, Yuechao, Jia, Yunpeng, Zhou, Xintian, Wu, Yu, Tang, Yun

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Genetically predicted telomere length and the risk of 11 hematological diseases: a Mendelian randomization study von Wang, Yimin, Liu, Qi, Liang, Shibing, Yao, Minghao, Zheng, Huimin, Hu, Dongqing, Wang, Yifei

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Single-Event Effects in SiC Double-Trench MOSFETs von Zhou, Xintian, Tang, Yun, Jia, Yunpeng, Hu, Dongqing, Wu, Yu, Xia, Tian, Gong, Hao, Pang, Haoyang

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Clinical application of autophagy proteins as prognostic biomarkers in colorectal cancer: a meta-analysis von Hu, Dongqing, Huo, Yanming, Xue, Ye, Feng, Haixia, Sun, Wei, Wang, Huiqi, Wu, Jing, Wang, Xiaoyan

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Gate Oxide Damage of SiC MOSFETs Induced by Heavy-Ion Strike von Zhou, Xintian, Pang, Haoyang, Jia, Yunpeng, Hu, Dongqing, Wu, Yu, Zhang, Shida, Li, Yuan, Li, Xinyu, Wang, Lihao, Fang, Xingyu, Zhao, Yuanfu

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Gate Bias Dependence of VTH Degradation in Planar and Trench SiC MOSFETs Under Repetitive Short Circuit Tests von Li, Yuan, Zhou, Xintian, Zhao, Yuanfu, Jia, Yunpeng, Hu, Dongqing, Wu, Yu, Zhang, Liqi, Chen, Zibo, Huang, Alex Q.

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Heavy-ion induced gate damage and thermal destruction in double-trench SiC MOSFETs von Wang, Lihao, Jia, Yunpeng, Zhou, Xintian, Zhao, Yuanfu, Wang, Liang, Li, Tongde, Hu, Dongqing, Wu, Yu, Deng, Zhonghan

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Numerical demonstration of SiC trench MOSFET with integrated heterojunction diode for enhanced performance von Wang, Lihao, Jia, Yunpeng, Zhou, Xintian, Zhao, Yuanfu, Hu, Dongqing, Wu, Yu, Deng, Zhonghan

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Synergistic Effect of Negative Bias Instability and Total Ionizing Dose on SiC MOSFETs von Tang, Yun, Wang, Lei, Cai, Xiaowu, Hu, Dongqing, Dong, Bin, Ding, Liqiang, Gao, Yuexin, Xia, Ruirui, Gao, Mali, Wang, Shiping, Dang, Jianying, Zhao, Fazhan, Li, Bo

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