From single III-nitride nanowires to piezoelectric generators: New route for powering nomad electronics von Gogneau, N, Jamond, N, Chrétien, P, Houzé, F, Lefeuvre, E, Tchernycheva, M

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Piezo-generator integrating a vertical array of GaN nanowires von Jamond, N, Chrétien, P, Houzé, F, Lu, L, Largeau, L, Maugain, O, Travers, L, Harmand, J C, Glas, F, Lefeuvre, E, Tchernycheva, M, Gogneau, N

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Field emission and material transfer in microswitches electrical contacts von Vincent, M., Rowe, S. W., Poulain, C., Mariolle, D., Chiesi, L., Houzé, F., Delamare, J.

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Nitride Nanowires: From Rigid to Flexible Piezo-generators von Lu, L., Jamond, N., Chrétien, P., Houzé, F., Travers, L., Harmand, J. C., Glas, F., Julien, F. H., Lefeuvre, E., Gogneau, N., Tchernycheva, M.

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Metal-rich Au-silicide nanoparticles for use in nanotechnology von Moyen, E., Macé, M., Agnus, G., Fleurence, A., Maroutian, T., Houzé, F., Stupakiewicz, A., Masson, L., Bartenlian, B., Wulfhekel, W., Beauvillain, P., Hanbücken, M.

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Multi-scale investigation of electronic transport and electromechanical behavior in carbon nanotube materials von Mdarhri, A., Alamarguy, D., Houzé, F., Noël, S., Volz, S., Li, H., Bai, J.B.

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Influence of morphology on the conductance of single-crystal diamond surfaces measured by atomic force microscopy von Tranvouez, E., Boer-Duchemin, E., Mayne, A. J., Vanderbruggen, T., Scheele, M., Cartwright, R., Comtet, G., Dujardin, G., Schneegans, O., Chrétien, P., Houzé, F.

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Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches von Peschot, A., Vincent, M., Poulain, C., Mariolle, D., Houzé, F., Delamare, J.

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High Sensitivity Piezogenerator Based on GaN Nanowires von L. Lu, N. Jamond, E. Lefeuvre, P. Chrétien, F. Houzé, L. Travers, J. C. Harmand, F. Glas, N. Gogneau, F. H. Julien, M. Tchernycheva

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Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes von Houzé, F., Meyer, R., Schneegans, O., Boyer, L.

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Determination of the Power Balance for Thin Ag-SnO₂ Electrodes Submitted to an Electric Arc Based on IR Thermography von Landfried, R., Boukhlifa, M., Houze, F., Leblanc, T., Teste, Ph

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Local photoconductivity on diamond metal-semiconductor-metal photodetectors measured by conducting probe atomic force microscopy von Alvarez, J., Kleider, J.P., Houzé, F., Liao, M.Y., Koide, Y.

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Electronic and topographic properties of amorphous and microcrystalline silicon thin films von Kleider, J.P., Longeaud, C., Brüggemann, R., Houzé, F.

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Electrical Conduction Properties of Molecular Ultrathin Layers in a Nanocontact von Noël, S, Alamarguy, D, Hauquier, F, Houzé, F, Viel, P, Palacin, S

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Mesostructure of polymer/carbon black composites observed by conductive probe atomic force microscopy von Ravier, J., Houzé, F., Carmona, F., Schneegans, O., Saadaoui, H.

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Conducting Probe-Mediated Electrochemical Nanopatterning of Molecular Materials von Schneegans, Olivier, Moradpour, Alec, Houzé, Frédéric, Angelova, Angelina, Henry de Villeneuve, Catherine, Allongue, Philippe, Chrétien, Pascal

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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy von Houzé, F., Alvarez, J., Kleider, J.-P., Bergonzo, P., Snidero, E., Tromson, D.

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The poly(ethylene terephthalate)/polyaniline composite : AFM, DRS and EPR investigations of some doping effects von PUD, A. A, TABELLOUT, M, KASSIBA, A, KORZHENKO, A. A, ROGALSKY, S. P, SHAPOVAL, G. S, HOUZE, F, SCHNEEGANS, O, EMERY, J. R

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Electrical Contact Reliability in a Magnetic MEMS Switch von Vincent, M., Chiesi, L., Fourrier, J.-C., Garnier, A., Grappe, B., Lapiere, C., Coutier, C., Samperio, A., Paineau, S., Houze, F., Noel, S.

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First AFM observation of thin cermet films close to the percolation threshold using a conducting tip von Gadenne, M, Schneegans, O, Houzé, F, Chrétien, P, Desmarest, C, Sztern, J, Gadenne, P

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