Structure, energetics, and thermal stability of nitrogen-vacancy-related defects in nitrogen doped silicon von KAROUI, A, SAHTOUT KAROUI, F, ROZGONYI, G. A, HOURAI, M, SUEOKA, K

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Microstructure and Thermal Stability of Electrodeposited Nanocrystalline Nickel von Hourai, M., Holdway, Philip, Cerezo, Alfred, Smith, George D.W.

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Effect of heavy boron doping on oxide precipitate growth in Czochralski silicon von ONO, T, ASAYAMA, E, HORIE, H, HOURAI, M, SUEOKA, K, TSUYA, H, ROZGONYI, G. A

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Growth Parameters Determining the Type of Grown-In Defects in Czockralski Silicon Crystals von Miki, Sakito, Umeno, S., Fujiwara, H., Sadamitsu, S., Hourai, M., Kajita, E., Shigematsu, T., Nagashima, T.

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Microstructure and Thermal Stability of Electrodeposited Nanocrystalline Nickel von Hourai, M., Holdway, Philip, Cerezo, Alfred, Smith, George D.W.

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3-D Atom Probe Studies of Some Nanostructured Materials von Lane, H., Thuvander, M., Hourai, M., Warren, Paul J., Cerezo, Alfred, Smith, George D.W.

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Dependence of the Grown-in Defect Distribution on Growth Rates in Czochralski Silicon von Sadamitsu, Shinsuke, Umeno, Shigeru, Koike, Yasuo, Hourai, Masataka, Shigeo Sumita, Shigeo Sumita, Tatsuhiko Shigematsu, Tatsuhiko Shigematsu

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Nitrogen effect on grown-in defects in Czochralski silicon crystals von Umeno, Shigeru, Ono, Toshiaki, Tanaka, Tadami, Asayama, Eiichi, Nishikawa, Hideshi, Hourai, Masataka, Katahama, Hisashi, Sano, Masakazu

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Formation behavior of infrared light scattering defects in silicon during Czochralski crystal growth von HOURAI, M, NAGASHIMA, T, KAJITA, E, MIKI, S, SHIGEMATSU, T, OKUI, M

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Dependence of Grown-in Defect Behavior on Oxygen Concentration in Czochralski Silicon Crystals von Umeno, Shigeru, Yanase, Yoshio, Hourai, Masataka, Sano, Masakazu, Shida, Yoshiaki, Tsuya, Hideki

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A novel approach to the characterization of growth striations in Czochralski silicon crystals von SHINTANI, A, MIYANO, T, HOURAI, M

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Formation of grown-in defects during Czochralski silicon crystal growth von NISHIKAWA, H, TANAKA, T, YANASE, Y, HOURAI, M, SANO, M, TSUYA, H

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Relationship between grown-in defects in Czochralski silicon crystals von UMENO, S, OKUI, M, HOURAI, M, SANO, M, TSUYA, H

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Characterization of Nucleation Sites in Nitrogen Doped Czochralski Silicon by Density Functional Theory and Molecular Mechanics von Hourai, M., Sahtout Karoui, F., Sueoka, Koji, Rozgonyi, George A., Karoui, A.

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Determination of the criteria for nucleation of ring-OSF from small as-grown oxygen precipitates in CZ-Si crystals von MARSDEN, K, KANDA, T, OKUI, M, HOURAI, M, SHIGEMATSU, T

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Interface fluctuations in Czochralski crystal growth von Miyano, Takaya, Shintani, Akira, Kanda, Tadashi, Hourai, Masataka

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Observation of ring-OSF nuclei in CZ-Si using short-time annealing and infrared light scattering tomography von MARSDEN, K, SADAMITSU, S, HOURAI, M, SUMITA, S, SHIGEMATSU, T

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Axial microscopic distribution of grown-in defects in Czochralski-grown silicon crystals von UMENO, S, SADAMITSU, S, MURAKAMI, H, HOURAI, M, SUMITA, S, SHIGEMATSU, T

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Characterization of complexities in Czochralski crystal growth by nonlinear forecasting von Miyano, Takaya, Morita, Hiroshi, Shintani, Akira, Kanda, Tadashi, Hourai, Masataka

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Influence of melt-temperature fluctuations on striation formation in large-scale Czochralski Si growth systems von Kanda, Tadashi, Hourai, Masataka, Miki, Shinichiro, Shigematsu, Tatsuhiko, Tomokage, Hajime, Miyano, Takaya, Morita, Hiroshi, Shintani, Akira

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