Correlation of Lifetime Mapping of 4H-SiC Epilayers with Structural Defects Using Synchrotron X-Ray Topography von Hosteller, J.L., Klein, Paul B., Guo, J.Q., Dudley, Michael, Goue, O.Y., Gaskill, D. Kurt, Yang, Yu, Raghothamachar, Balaji, Myers-Ward, Rachael L.

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