Synthesis of Graphitic Mesoporous Carbon from Metal Impregnated Silica Template for Proton Exchange Membrane Fuel Cell Application von Sultana, K. N., Worku, D., Hossain, M. T. Z., Ilias, S.

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Measurement of the 36Ar(n, p) 36Cl cross section at thermal energies using the AMS technique von Jiang, S.S., Hemmick, T.K., Kubik, P.W., Elmore, D., Gove, H.E., Tullai-Fitzpatrick, S., Hossain, T.Z.

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Impurity study of alumina and aluminum nitride ceramics: Microelectronics packaging applications von Kerness, N.D., Hossain, T.Z., McGuire, S.C.

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Neutron activation analysis of aluminum in Mg 2SiO 4 von Mass, J.L., Burlitch, J.M., McGuire, S.C., Hossain, T.Z., Demiralp, R.

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Infrared spectroscopy of the stretching modes of SeH − and TeH − in KCl and KBr von Mungan, C.E., Happek, U., Hossain, T.Z., Sievers, A.J.

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Neutron activation analysis of aluminum in Mg2SiO4 von Mass, J.L., Burlitch, J.M., McGuire, S.C., Hossain, T.Z., Demiralp, R.

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Multielement matrix analysis using reactor spectrum neutrons von McGuire, S.C., Hossain, T.Z., Golkowski, C., Kerness, N.D., Sulcer, J.D.

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1266-keV gamma branch in [sup 31]Si decay von McGuire, S.C., Hossain, T.Z., Soave, R.J.

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Applications of AMS to electronic and silver halide imaging research von Gove, H.E., Kubik, P.W., Sharma, P., Datar, S., Fehn, U., Hossain, T.Z., Koffer, J., Lavine, J.P., Lee, S.-T., Elmore, D.

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Nondestructive determination of boron doses in semiconductor materials using neutron depth profiling von Onlu, K., Saglam, M., Wehring, B.W., Hossain, T.Z., Custodio, E., Lowell, J.K.

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Gpnocsim - A General Purpose Simulator for Network-On-Chip von Hossain, H., Ahmed, M., Al-Nayeem, A., Islam, T.Z., Akbar, M.

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