Formation of double-monolayer-height islands on a Si(001) surface by alternating current heating in molecular beam epitaxy von Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki, Kakibayashi, Hiroshi

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Observation of Si(001) surface domains in absorption current images of an electron microscope von DOI, T, ICHIKAWA, M, HOSOKI, S

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In situ observation of gold adsorption onto Si(111)7×7 surface by scanning tunneling microscopy von HASEGAWA, T, HOSAKA, S, HOSOKI, S

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The driving force of Si adsorbate transfer on a Si(001) surface von Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki

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Tunneling acoustic microscope von Takata, Keiji, Hasegawa, Tsuyoshi, Hosaka, Sumio, Hosoki, Shigeyuki, Komoda, Tsutomu

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Observation of pn junctions on implanted silicon using a scanning tunneling microscope von HOSAKA, S, HOSOKI, S, TAKATA, K, HORIUCHI, K, NATSUAKI, N

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Fast scanning tunneling microscope for dynamic observation von Hosaka, Sumio, Hasegawa, Tsuyoshi, Hosoki, Shigeyuki, Takata, Keiji

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Observation of 1-nm-high structures on a Si(001) surface using a differential interference optical microscope von DOI, T, ISHIZAKA, A, ICHIKAWA, M, HOSOKI, S, NINOMIYA, K

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Tunneling acoustic microscope von TAKATA, K, YUGAMI, J, HASEGAWA, T, HOSAKA, S, HOSOKI, S, KOMODA, T

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Field-ion and electron microscopies of carbon tips von Futamoto, Masaaki, Hosoki, Shigeyuki, Kawabe, Ushio

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5585722 Apparatus for measuring physical properties of micro area von Hosoki, Shigeyuki, Hasegawa, Tsuyoshi, Kohno, Makiko

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Stable phase boundaries between the 7 × 7 and the 5 × 2 Au structures on a Si(111) surface studied by high-temperature STM von Hasegawa, Tsuyoshi, Hosoki, Shigeyuki, Yagi, Katsumichi

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Fourth power law of time dependence of Si adsorbate diffusion on a Si(001) surface von Doi, Takahisa, Ichikawa, Masakazu, Hosoki, Shigeyuki

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Scanning Tunneling Microscopy von HOSOKI, Shigeyuki

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Dynamic observation of Si-island growth on a Si(111)-7 × 7 surface by high-temperature scanning tunneling microscopy von Hasegawa, Tsuyoshi, Shimada, Wataru, Tochihara, Hiroshi, Hosoki, Shigeyuki

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Development of a Practical Scanning Tunneling Microscope (STM) and Surface Observations von HOSAKA, Sumio, HOSOKI, Shigeyuki, TAKATA, Keiji, HARADA, Tatsuo, KATOH, Keizoh

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STM modification of MoS 2 in the nanometer-scale using a gas—solid reaction von Kohno, Makiko, Doi, Takahisa, Hasegawa, Tsuyoshi, Tomimatsu, Satoshi, Hosoki, Shigeyuki

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Observation of Si(111) surface steps from scanning microscope images of the sample absorption current von Doi, Takahisa, Nakahara, Hitoshi, Ichikawa, Masakazu, Hosoki, Shigeyuki

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Observation of Surface Defects Using a Scanning Tunneling Microscope (STM) von HOSOKI, Shigeyuki, HOSAKA, Sumio, TAKATA, Keiji, HASEGAWA, Tsuyoshi, NOMURA, Setsuo

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STM modification of MoS2 in the nanometer-scale using a gas—solid reaction von Kohno, Makiko, Doi, Takahisa, Hasegawa, Tsuyoshi, Tomimatsu, Satoshi, Hosoki, Shigeyuki

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