Effect of interfacial oxide thickness on 1/f noise in polysilicon emitter BJTs von Md Mazhar Ul Hoque, Celik-Butler, Z., Lan, D., Weiser, D., Trogolo, J., Green, K.R.

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1 ∕ f noise in positive-negative-positive (PNP) polycrystalline silicon-emitter bipolar transistors von Hoque, Md Mazhar Ul, Celik-Butler, Zeynep, Trogolo, Joe, Weiser, Douglas, Green, Keith

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Dependence of low frequency noise in SiGe heterojunction bipolar transistors on the dimensional and structural features of extrinsic regions von Ul Hoque, Md Mazhar, Çelik-Butler, Zeynep, Martin, Samuel, Knorr, Chris, Bulucea, Constantin

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Semiconductor device and related protection methods von De Souza Richard J, Parris Patrice M, Hoque Mazhar Ul, Chen Weize

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Semiconductor device and related fabrication methods von De Souza Richard J, Parris Patrice M, Hoque Mazhar Ul, Chen Weize

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SEMICONDUCTOR DEVICE AND RELATED PROTECTION METHODS von DE SOUZA RICHARD J, CHEN WEIZE, PARRIS PATRICE M, HOQUE MAZHAR UL

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SEMICONDUCTOR DEVICE AND RELATED FABRICATION METHODS von DE SOUZA RICHARD J, CHEN WEIZE, PARRIS PATRICE M, HOQUE MAZHAR UL

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