Electroluminescence of erbium–oxygen-doped silicon diodes grown by molecular beam epitaxy von Stimmer, J., Reittinger, A., Nützel, J. F., Abstreiter, G., Holzbrecher, H., Buchal, Ch

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Erbium incorporation in LiNbO3 by diffusion-doping von BAUMANN, I, BRINKMANN, R, GOG, T, MATERLIK, G, WITTE, O, STOLZ, H, VON DER OSTEN, W, DINAND, M, SOHLER, W, BECKERS, L, BUCHAL, C, FLEUSTER, M, HOLZBRECHER, H, PAULUS, H, MÜLLER, K.-H

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Influence of germanium content on the photoluminescence of erbium- and oxygen-doped SiGe grown by molecular beam epitaxy von Neufeld, E., Sticht, A., Brunner, K., Abstreiter, G., Holzbrecher, H., Bay, H., Buchal, Ch

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Trace and surface analysis of ceramic layers of solid oxide fuel cells by mass spectrometry von BECKER, J. S, BREUER, U, WESTHEIDE, J, SAPRYKIN, A. I, HOLZBRECHER, H, NICKEL, H, DIETZE, H.-J

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Luminescence from erbium- and oxygen-doped SiGe grown by molecular beam epitaxy von Neufeld, E, Sticht, A, Brunner, K, Abstreiter, G, Bay, H, Buchal, Ch, Holzbrecher, H

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Erbium–silicon light-emitting diodes grown by molecular beam epitaxy: optical properties von Stimmer, J., Reittinger, A., Neufeld, E., Abstreiter, G., Holzbrecher, H., Breuer, U., Buchal, Ch

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Praseodymium-doped Ti:LiNbO3 waveguides von BAUMANN, I, CUSSO, F, HERREROS, B, HOLZBRECHER, H, PAULUS, H, SCHÄFER, K, SOHLER, W

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Analysis of composition and growth mechanisms of oxide scales on high temperature alloys by SNMS, SIMS, and RBS von QUADAKKERS, W. J, ELSCHNER, A, HOLZBRECHER, H, SCHMIDT, K, SPEIER, W, NICKEL, H

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Phosphorus redistribution during the formation of buried CoSi2 layers by ion beam synthesis von Schüppen, A., Jebasinski, R., Mantl, S., Marso, M., Lüth, H., Breuer, U., Holzbrecher, H.

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Determination of lattice and grain boundary diffusion coefficients in protective alumina scales on high temperature alloys using SEM, TEM and SIMS von CLEMENS, D, BONGARTZ, K, QUADAKKERS, W. J, NICKEL, H, HOLZBRECHER, H, BECKER, J.-S

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Comparative studies of MCs+-SIMS and e--beam SNMS for quantitative analysis of bulk materials and layered structures von BREUER, U, HOLZBRECHER, H, GASTEL, M, BECKER, J. S, DIETZE, H.-J

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Quantitative analysis of oxide films on ODS-alloys using MCs+-SIMS and e-beam SNMS von PFEIFER, J.-P, HOLZBRECHER, H, QUADAKKERS, W. J, BREUER, U, SPEIER, W

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Depth profile analysis of thin film solar cells using SNMS and SIMS von GASTEL, M, BREUER, U, HOLZBRECHER, H, BECKER, J. S, DIETZE, H.-J, WAGNER, H

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The influence of an epitaxial CoSi2 layer on diffusion of B and Sb in underlying Si during oxidation von TYAGI, A. K, BREUER, U, HOLZBRECHER, H, BECKER, J. S, DIETZE, H.-J, KAPPIUS, L, BAY, H. L, MANTL, S

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Quantitative SIMS-analysis of erbium profiles in LiNbO3 von Holzbrecher, H., Breuer, U., Gastel, M., Becker, J. S., Dietze, H.-J., Beckers, L., Bauer, St, Fleuster, M., Zander, W., Schubert, J., Buchal, Ch

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Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment von BREUER, U, HOLZBRECHER, H, GASTEL, M, BECKER, J. S, DIETZE, H.-J

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Formation of CoSi2 in SIMOX wafers by high dose cobalt implantation von Sjoreen, T.P., Jebasinski, R., Schmidt, K., Mantl, S., Holzbrecher, H., Speier, W.

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Quantitative determination of element distributions in silicon based thin film solar cells using SNMS von GASTEL, M, BREUER, U, HOLZBRECHER, H, BECKER, J. S, DIETZE, H.-J, KUBON, M, WAGNER, H

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Cross calibration of secondary ion mass spectrometers von Ruedenauer, Friedrich, Steiger, Wolfgang, Riedel, Miklos, Beske, Horst E, Holzbrecher, Horst, Gericke, Michael, Richter, Carl Ernst, Rieth, Michael, Trapp, Manfred, et al, .

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Praseodymium-doped Ti:LiNbO 3 waveguides von Baumann, I., Cusso, F., Herreros, B., Holzbrecher, H., Paulus, H., Schäfer, K., Sohler, W.

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