The mechanism of corrosion inhibition of copper in NaCl solution by benzotriazole studied by electron spectroscopy von Hashemi, T., Hogarth, C.A.

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Conduction mechanisms in amorphous tellurium films von Ray, A.K., Swan, R., Hogarth, C.A.

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The role of rare-earth ions in electronically conducting glasses von Hogarth, C.A., Khan, M.N.

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X-ray photoelectron spectroscopic studies of thin amorphous films of MoO3/In2O3 (deposited by co-evaporation) von ANWAR, M, KHAN, G. A, HOGARTH, C. A, BULPETT, R

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The electrical characteristics of porous Al2O3 produced by anodization von Gould, R.D., Hogarth, C.A.

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An analysis of polymeric thick-film resistors as pressure sensors von Arshak, K.I., Ray, A.K., Hogarth, C.A., Collins, D.G., Ansari, F.

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Hall effect and magnetoresistance in Au/SiO x thin films von Steele, C.B., Beynon, J., Hogarth, C.A.

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X-ray induced Auger spectroscopy of the surface films formed by benzo- triazole on zinc and zinc alloys von Hashemi, T., Hogarth, C.A.

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Room temperature toluene sensing using phthalocyanine Langmuir-Blodgett films von Mukhopadhyay, S., Hogarth, C.A., Thorpe, S.C., Cook, M.J.

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Hall effect and magnetoresistance in Au/SiOx thin films von STEELE, C. B, BEYNON, J, HOGARTH, C. A

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Elements of Electronics for Physical Scientists von Hogarth, C.A.

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X-ray photoelectron spectroscopy of dielectric films of CeO 2, CeO 2/Cd, and CeO 2/SiO prepared by thermal evaporation von Al-Dhhan, Z.T., Hashemi, T., Hogarth, C.A.

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The electrical activation energy in CdO-P 2O 5 glasses under high and low electric fields von Ghauri, M., Hogarth, C.A.

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Transistor electronics in instrument technology von Hogarth, C.A.

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Utilisation des transistors von Hogarth, C.A.

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A study of thermal-voltage memory effects in M-I-M structures with co-evaporated SiO/B 2 O 3 as the insulator material von HOGARTH, C.A., KOMPANY, A.

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The electrical characteristics of porous Al 2O 3 produced by anodization von Gould, R.D., Hogarth, C.A.

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Effects of annealing on the structure, electron spin resonance and optical energy gap of thin BaO-SiO films von Arshak, K.I., Hogarth, C.A.

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The use of the electron microprobe analyser for the study of the composition of the terminations of conducting filaments in MIM structures von Rakhshani, A.E., Hogarth, C.A.

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Memory switching in BaOZnOP 2O 5 glasses in thin film form von Hogarth, C.A., Anvari, S.F.

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