Crystalline defect formation on aluminum bond pads during CMOS wafer storage and process strategies for defect elimination von Pani, Santosh Kumar, Hogan, Royston Hugh, Pandurangan, Madhavan, Nistala, Ramesh Rao

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Generation and elimination of silicon pitting for 300 mm CMOS process technologies von Pani, Santosh Kumar, Hogan, Royston Hugh, Pandurangan, Madhavan, Zhang, Jian, Koesun, Pak

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Electronic structure and bonding in four-coordinate organometallic complexes of aluminum. Valence photoelectron spectra of BHT-H, Me3Al(PMe3), and Me2(BHT)Al(PMe3) von Lichtenberger, Dennis L, Hogan, Royston H, Healy, Matthew D, Barron, Andrew R

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MIXED STRAIN MULTI-QUANTUM WELL SUPERLUMINESCENT LIGHT EMITTING DIODE von RAJGOPAL, Rajan, PIPER, Andy, DHEERAJ, Dasa Lakshmi Narayana, HOGAN, Royston, RAI, Ashish Kumar

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Electronic structure and bonding in four-coordinate organometallic complexes of aluminum. Valence photoelectron spectra of Me3Al(pyridine) and Me2(BHT)Al(pyridine) (BHT = 2,6-di-te... von Lichtenberger, Dennis L, Hogan, Royston H, Healy, Matthew D, Barron, Andrew R

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MIXED STRAIN MULTI-QUANTUM WELL SUPERLUMINESCENT LIGHT EMITTING DIODE von RAJGOPAL, Rajan, PIPER, Andy, DHEERAJ, Dasa Lakshmi Narayana, HOGAN, Royston, RAI, Ashish Kumar

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MIXED STRAIN MULTI-QUANTUM WELL SUPERLUMINESCENT LIGHT EMITTING DIODE von Dheeraj, Dasa Lakshmi Narayana, Rai, Ashish Kumar, Hogan, Royston, Rajgopal, Rajan, Piper, Andy

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Hybrid strained multi-quantum well super-radiation light emitting diode von RAJ ASHISH KUMAR, PIPER ANDY, RAJGOPAL, RAJAN, DIJEAN, DASHA, LAXMI, RANAIN, HOGAN ROYSTON

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