Replication of micro and nano surface geometries von Hansen, H.N., Hocken, R.J., Tosello, G.

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Characterization and compensation of dynamic errors of a scanning coordinate measuring machine von Pereira, P.H., Hocken, R.J.

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Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine von Ramu, P., Yagüe, J.A., Hocken, R.J., Miller, J.

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Task Specific Uncertainty in Coordinate Measurement von Wilhelm, R.G., Hocken, R., Schwenke, H.

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Atomic force microscope for accurate dimensional metrology von Mazzeo, A.D., Stein, A.J., Trumper, D.L., Hocken, R.J.

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Alignment uncertainties in ideal indentation styli von Ellis, J.D., Smith, S.T., Hocken, R.J.

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Optical metrology of surfaces von HOCKEN, R. J, CHAKRABORTY, N, BROWN, C

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Dynamics and Control of the UNCC/MIT Sub-Atomic Measuring Machine von Hocken, R.J., Trumper, D.L., Wang, C.

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Engineering Nanotechnology: The Top Down Approach von Hocken, Robert J., Fesperman, R., Stroup, C., Overcash, J., Ozturk, O.

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Performance Evaluation of Ultra-Precision Motion Controlled Positioning Stage von Smith, S.T., Hocken, Robert J., Buice, Eric S., Trumper, D.L., Otten, D.

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The long-range scanning stage: a novel platform for scanned-probe microscopy von Holmes, Mike, Hocken, Robert, Trumper, David

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Self-Calibration: Reversal, Redundancy, Error Separation, and ‘Absolute Testing’ von Evans, Chris J., Hocken, Robert J., Estler, W. Tyler

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Evaluation of Runout Deviation at Bevel Gears based on Pitch Measurements von Guenther, A., Hocken, R.

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A Displacement Method for Machine Geometry Calibration von Zhang, G., Ouyang, R., Lu, B., Hocken, R., Veale, R., Donmez, A.

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Error Compensation of Coordinate Measuring Machines von Zhang, G., Veale, R., Charlton, T., Borchardt, B., Hocken, R.

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Resonance based pressure measurement and anemometry for high temperature flows: Design principles and preliminary results von Keanini, Russell, Phan, Son, Smith, Stuart, Hocken, Robert

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Magnetic Bearing Stage for Photolithography von Williams, M.E., Trumper, D.L., Hocken, R.

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Automatic laser tracking interferometer system for robot metrology von Lau, K., Hocken, R.J., Haight, W.C.

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A portable three-dimensional stylus profile measuring instrument von Badami, V.G., Smith, S.T., Raja, J., Hocken, R.J.

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A general methodology for machine tool accuracy enhancement by error compensation von Donmez, M.A., Blomquist, D.S., Hocken, R.J., Liu, C.R., Barash, M.M.

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