Growth of silicene layers on Ag(111): unexpected effect of the substrate temperature von Jamgotchian, H, Colignon, Y, Hamzaoui, N, Ealet, B, Hoarau, J Y, Aufray, B, Bibérian, J P

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Experimental assessment of the accuracy of genomic selection in sugarcane von Gouy, M, Rousselle, Y, Bastianelli, D, Lecomte, P, Bonnal, L, Roques, D, Efile, J.-C, Rocher, S, Daugrois, J, Toubi, L, Nabeneza, S, Hervouet, C, Telismart, H, Denis, M, Thong-Chane, A, Glaszmann, J. C, Hoarau, J.-Y, Nibouche, S, Costet, L

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A comprehensive study of the (2 3  ×  2 3)R30° structure of silicene on Ag(1 1 1) von Jamgotchian, H, Ealet, B, Colignon, Y, Maradj, H, Hoarau, J-Y, Biberian, J-P, Aufray, B

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Perylene tetracarboxylic diimide ultrathin film deposition on Pt(1 0 0): a LEED, AES, REELS and STM study von Guillermet, O., Glachant, A., Hoarau, J.Y., Mossoyan, J.C., Mossoyan, M.

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Growth mode and dissolution kinetics of germanium thin films on Ag(001) surface: an AES–LEED investigation von Oughaddou, H., Aufray, B., Bibérian, J.P., Hoarau, J.Y.

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Unexpected behaviour of one Pb monolayer deposited on aluminum oxide thin film grown on Ag(111) von Vizzini, Sébastien, Oughaddou, Hamid, Hoarau, J. Y., Biberian, J. P., Bertoglio, M., Aufray, B.

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Determination of the electrical properties of 2.5 nm thick silicon-based dielectric films: thermally grown SiOx von PIC, N, GLACHANT, A, NITSCHE, S, HOARAU, J. Y, GOGUENHEIM, D, VUILLAUME, D, SIBAI, A, AUTRAN, J.-L

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Y growth of ultrathin film aluminum oxide on Ag(111) von Vizzini, S., Oughaddou, H., Hoarau, J.Y., Biberian, J.P., Aufray, B.

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Characterisation of genome regions incorporated from an important wild relative into Australian sugarcane von Reffay, N, Jackson, P.A, Aitken, K.S, Hoarau, J.Y, D'Hont, A, Besse, P, McIntyre, C.L

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Determination of the electrical properties of thermally grown ultrathin nitride films von Pic, N, Glachant, A, Nitsche, S, Hoarau, J.Y, Goguenheim, D, Vuillaume, D, Sibai, A, Chanelière, C

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Haplotype structure around Bru 1 reveals a narrow genetic basis for brown rust resistance in modern sugarcane cultivars von Costet, Laurent, Le Cunff, Loic L., Royaert, S., Raboin, Louis-Marie, Hervouet, Catherine, Toubi, L., Telismart, H., Garsmeur, Olivier, Rouselle, Y., Pauquet, J., Nibouche, Samuel, Glaszmann, Jean-Christophe, Hoarau, J.Y., d'Hont, Angélique

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A putative major gene for rust resistance linked with a RFLP marker in sugarcane cultivar 'R570' von Daugrois, J.H, Grivet, L, Roques, D, Hoarau, J.Y, Lombard, H, Glaszmann, J.C, D'Hont, A. (CIRAD, Guadeloupe (France). Station de Roujol)

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Determination of the electrical properties of ultrathin silicon-based dielectric films: thermally grown SiNx von Pic, N., Glachant, A., Nitsche, S., Hoarau, J.Y., Goguenheim, D., Vuillaume, D., Sibai, A., Chaneliere, C.

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Determination of the electrical properties of 2.5 nm thick silicon-based dielectric films: thermally grown SiO x von Pic, N., Glachant, A., Nitsche, S., Hoarau, J.Y., Goguenheim, D., Vuillaume, D., Sibai, A., Autran, J.-L.

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Determination of the electrical properties of 2.5nm thick silicon-based dielectric films : thermally grown SiOx von Pic, N., Glachant, A., Nitsche, S., Hoarau, J.Y., Goguenheim, D., Vuillaume, D., Sibai, A., Autran, Jean-Luc

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Improvement of Yield per se in Sugarcane von Gouy, M, Nibouche, S, Hoarau, J.Y, Costet, L

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A new approach in the development and testing of antifouling paints without organotin derivatives von VALLEE-REHEL, K, MARIETTE, B, HOARAU, P. A, GUERIN, P, LANGLOIS, V, LANGLOIS, J. Y

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