A simple atomic force microscope-based method for quantifying wear of sliding probes von Flater, Erin E., Barnes, Jared D., Hitz Graff, Jesse A., Weaver, Jayse M., Ansari, Naveed, Poda, Aimee R., Robert Ashurst, W., Khanal, Subarna R., Jacobs, Tevis D. B.

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