A simple method to observe water distribution in tracheid-bearing wood of subalpine conifer von Taneda, Haruhiko, Yazaki, Kenich, Hiramatsu, Tokiyoshi, Shimizu, Bunnichi, Sugiura, Daisuke, Miyazawa, Yoshiyuki

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Bottom-Gate Zinc Oxide Thin-Film Transistors (ZnO TFTs) for AM-LCDs von Hirao, T., Furuta, M., Hiramatsu, T., Matsuda, T., Chaoyang Li, Furuta, H., Hokari, H., Yoshida, M., Ishii, H., Kakegawa, M.

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Analysis of Hump Characteristics in Thin-Film Transistors With ZnO Channels Deposited by Sputtering at Various Oxygen Partial Pressures von Furuta, Mamoru, Kamada, Yudai, Kimura, Mutsumi, Hiramatsu, Takahiro, Matsuda, Tokiyoshi, Furuta, Hiroshi, Chaoyang Li, Fujita, Shizuo, Hirao, Takashi

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Behavior of oxygen in zinc oxide films through thermal annealing and its effect on sheet resistance von Hiramatsu, Takahiro, Furuta, Mamoru, Matsuda, Tokiyoshi, Li, Chaoyang, Hirao, Takashi

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Extraction of Trap Densities in ZnO Thin-Film Transistors and Dependence on Oxygen Partial Pressure During Sputtering of ZnO Films von Kimura, M., Furuta, M., Kamada, Y., Hiramatsu, T., Matsuda, T., Furuta, H., Li, C., Fujita, S., Hirao, T.

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Mechanism analysis of photoleakage current in ZnO thin-film transistors using device simulation von Kimura, Mutsumi, Kamada, Yudai, Fujita, Shizuo, Hiramatsu, Takahiro, Matsuda, Tokiyoshi, Furuta, Mamoru, Hirao, Takashi

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Stacked Image Sensor With Green- and Red-Sensitive Organic Photoconductive Films Applying Zinc Oxide Thin-Film Transistors to a Signal Readout Circuit von Aihara, S., Seo, H., Namba, M., Watabe, T., Ohtake, H., Kubota, M., Egami, N., Hiramatsu, T., Matsuda, T., Furuta, M., Nitta, H., Hirao, T.

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Effects of chemical stoichiometry of channel region on bias instability in ZnO thin-film transistors von Kamada, Yudai, Fujita, Shizuo, Kimura, Mutsumi, Hiramatsu, Takahiro, Matsuda, Tokiyoshi, Furuta, Mamoru, Hirao, Takashi

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Thermal stability of ZnO thin film prepared by RF-magnetron sputtering evaluated by thermal desorption spectroscopy von Matsuda, Tokiyoshi, Furuta, Mamoru, Hiramatsu, Takahiro, Furuta, Hiroshi, Li, Chaoyang, Hirao, Takashi

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Novel top-gate zinc oxide thin-film transistors (ZnO TFTs) for AMLCDs von Hirao, Takashi, Furuta, Mamoru, Furuta, Hiroshi, Matsuda, Tokiyoshi, Hiramatsu, Takahiro, Hokari, Hitoshi, Yoshida, Motohiko, Ishii, Hiromitsu, Kakegawa, Masayuki

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Influence of amorphous buffer layers on the crystallinity of sputter-deposited undoped ZnO films von Matsuda, Tokiyoshi, Furuta, Mamoru, Hiramatsu, Takahiro, Li, Chaoyang, Furuta, Hiroshi, Hokari, Hitoshi, Hirao, Takashi

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Effect of substrate bias on crystal structure and thermal stability of sputter-deposited ZnO films von Hiramatsu, Takahiro, Furuta, Mamoru, Furuta, Hiroshi, Matsuda, Tokiyoshi, Li, Chaoyang, Hirao, Takashi

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Comparison of structural and photoluminescence properties of zinc oxide nanostructures influenced by gas ratio and substrate bias during radio frequency sputtering von Li, Chaoyang, Matsuda, Tokiyoshi, Kawaharamura, Toshiyuki, Furuta, Hiroshi, Furuta, Mamoru, Hiramatsu, Takahiro, Hirao, Takashi, Nakanishi, Yoichiro, Ichinomiya, Keiji

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Low temperature deposition of SiOx insulator film with newly developed facing electrodes chemical vapor deposition von Matsuda, Tokiyoshi, Furuta, Mamoru, Hiramatsu, Takahiro, Furuta, Hiroshi, Kawaharamura, Toshiyuki, Hirao, Takashi

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Intense Green Cathodoluminescence from Low-Temperature-Deposited ZnO Film with Fluted Hexagonal Cone Nanostructures von Li, Chaoyang, Kawaharamura, Toshiyuki, Matsuda, Tokiyoshi, Furuta, Hiroshi, Hiramatsu, Takahiro, Furuta, Mamoru, Hirao, Takashi

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Crystallinity and resistivity of ZnO thin films with indium implantation and postannealing von Matsuda, Tokiyoshi, Furuta, Mamoru, Hiramatsu, Takahiro, Furuta, Hiroshi, Hirao, Takashi

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Influence of Thermal Annealing on Microstructures of Zinc Oxide Films Deposited by RF Magnetron Sputtering von Hiramatsu, Takahiro, Furuta, Mamoru, Furuta, Hiroshi, Matsuda, Tokiyoshi, Hirao, Takashi

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Effect of Energetic Particle Bombardment on Microstructure of Zinc Oxide Films Deposited by RF Magnetron Sputtering von Furuta, Mamoru, Hiramatsu, Takahiro, Matsuda, Tokiyoshi, Furuta, Hiroshi, Hirao, Takashi

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Photo-Leakage Current of Zinc Oxide Thin-Film Transistors von Kamada, Yudai, Fujita, Shizuo, Hiramatsu, Takahiro, Matsuda, Tokiyoshi, Nitta, Hiroshi, Furuta, Mamoru, Hirao, Takashi

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Reduction of Photo-Leakage Current in ZnO Thin-Film Transistors With Dual-Gate Structure von Kamada, Y, Fujita, S, Kimura, M, Hiramatsu, T, Matsuda, T, Furuta, M, Hirao, T

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