Ultra-shallow junction (USJ) sheet resistance measurements with a non-penetrating four point probe von Benjamin, M.C., Hillard, R.J., Borland, J.O.

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Optimization of the spreading resistance profiling technique for submicron structures von Berkowitz, H.L., Burnell, D.M., Hillard, R.J., Mazur, R.G., Rai-Choudhury, P.

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The role of spreading resistance profiling in manufacturing control and technology development von Lin-Kwang, J., Ramey, S., Reynes, J.M., Hillard, R.J., Thieme, T.

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Accurate determination of ultra-shallow junction sheet resistance with a non-penetrating four point probe von Hillard, R.J., Borland, J., Win Ye, C.

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Determination of Activated Dopant Profiles with a Novel FastGate® Probe von Hillard, R.J., Ye, C.W., Benjamin, M.C., Suguro, K.

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A pressure contact current-voltage technique for rapid characterization of thin dielectric films von Karulkar, Pramod C., Hillard, R.J., Heddleson, J.M., Rai-Choudhury, P.

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SOI material properties determined by electrical characterization von Rai-Choudhury, P., Hillard, R.J., Heddleson, J.M., Weinzierl, S.R., Abe, T., Karulkar, P., Pawlik, M.

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Monitoring the micro-uniformity performance of a spinning disk implanter von Current, Michael I., Guitner, Tim, Ohno, Naotsugu, Hurley, Kurt, Keenan, W.A., Johnson, Walt, Hillard, R.J., Jeynes, C.

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In-line detection of radial non-uniformity of V/sub T/-adjust implants in 200 mm wafers using Hg-probe C-V carrier depth profiling von Weinzierl, S.R., Hillard, R.J., Gruber, G.A.

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Hydrogen Passivation of Shallow and Deep Centers in GaSb von Milnes, A.G., Hillard, R.J., Bao, X.J., Pearton, Stephen J., Polyakov, A.Y., Schlesinger, T.E., Rai-Choudhury, P., Wilson, R.G., Stam, M.

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Electrical characterization of 180 nm CMOS devices by spreading resistance profiling von Hartford, C.L., Ramey, S.M., Hillard, R.J., Hartford, E.J., Mazur, R.G., Kandler, E.

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Effect of buried oxide charge on SOI spreading resistance profile von Karulkar, P.C., Hillard, R.J., Heddleson, J.M., Rai-Choudhury, P., Abe, T.

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Charge trapping in single and multiple implant SIMOX buried oxides von Hillard, R.J., Heddleson, J.M., Rai-Choudhury, P., Karulkar, P.C.

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Profiling of compound semiconductors using point contact techniques: Part 2 von Hillard, R.J., Berkowitz, H.L., Heddleson, J.M., Mazur, R.G., Rai-Choudhury, P.

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Profiling of compound semiconductors using point contact techniques von Hillard, R.J., Berkowitz, H.L., Heddleson, J.M., Mazur, R.G., Rai-Choudhury, P.

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Upregulation of CB1 receptor binding in the ventromedial prefrontal cortex promotes proactive stress-coping strategies following chronic stress exposure von McLaughlin, R.J., Hill, M.N., Dang, S.S., Wainwright, S.R., Galea, L.A.M., Hillard, C.J., Gorzalka, B.B.

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Clinical outcomes of patients with desmoplastic small round cell tumor of the peritoneum undergoing autologous HCT: a CIBMTR retrospective analysis von Cook, R J, Wang, Z, Arora, M, Lazarus, H M, Kasow, K A, Champagne, M A, Saber, W, van Besien, K M, Hale, G A, Copelan, E A, Elmongy, M, Ueno, N T, Horn, B N, Slavin, S, Bishop, M R, Stadtmauer, E A

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Flow visualization using fluorescence from locally seeded I2 excited by an ArF excimer laser von EXTON, R. J, BALLA, R. J, SHIRINZADEH, B, HILLARD, M. E, BRAUCKMANN, G. J

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Analysis of the diffuse bands near 6100 Å in the fluorescence spectrum of Cs2 von Tellinghuisen, Joel, Pichler, Goran, Snow, W.L., Hillard, M.E., Exton, R.J.

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Response of broilers to moenomycin von Waldroup, P.W, Hillard, C.M, Mitchell, R.J, Sloan, D.R

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