Reliable modeling of ultrathin alternative plasmonic materials using spectroscopic ellipsometry [Invited] von Secondo, R., Fomra, D., Izyumskaya, N., Avrutin, V., Hilfiker, J. N, Martin, A., Özgür, Ü., Kinsey, N.

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Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength range von Khoshman, J.M., Hilfiker, J.N., Tabet, N., Kordesch, M.E.

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Physical and chemical properties of sputter-deposited TaCxNy films von Aouadi, S M, Zhang, Y, Basnyat, P, Stadler, S, Filip, P, Williams, M, Hilfiker, J N, Singh, N, Woollam, J A

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Vacuum ultra-violet spectroscopic ellipsometry study of single- and multi-phase nitride protective films von Aouadi, S M, Bohnhoff, A, Amriou, T, Williams, M, Hilfiker, J N, Singh, N, Woollam, J A

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Polarization resolved reflection from ordered vertical silicon nanowire arrays von Khorasaninejad, M, Abedzadeh, N, Sun, J, Hilfiker, J N, Saini, S S

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Optical properties of bulk and thin-film SrTiO3 on Si and Pt von Zollner, Stefan, Demkov, A. A., Liu, R., Fejes, P. L., Gregory, R. B., Alluri, Prasad, Curless, J. A., Yu, Z., Ramdani, J., Droopad, R., Tiwald, T. E., Hilfiker, J. N., Woollam, J. A.

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Microstructural and infrared optical properties of electrochemically etched highly doped 4H–SiC von Zangooie, S., Persson, P. O. A., Hilfiker, J. N., Hultman, L., Arwin, H.

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Calibration of a multi-pass photoacoustic spectrometer cell using light-absorbing aerosols von Bluvshtein, Nir, Flores, J. Michel, He, Quanfu, Segre, Enrico, Segev, Lior, Hong, Nina, Donohue, Andrea, Hilfiker, James N, Rudich, Yinon

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Coplanar transmission lines on thin substrates for high-speed low-loss propagation von Frankel, M.Y., Voelker, R.H., Hilfiker, J.N.

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Generalized spectroscopic ellipsometry and Mueller-matrix study of twisted nematic and super twisted nematic liquid crystals von Hilfiker, J.N., Johs, B., Herzinger, C.M., Elman, J.F., Montbach, E., Bryant, D., Bos, P.J.

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Ellipsometry characterization of bulk acoustic wave filters von Nolot, E., Lefevre, A., Hilfiker, J. N.

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Mueller-matrix characterization of liquid crystals von Hilfiker, J.N., Herzinger, C.M., Wagner, T., Marino, Antigone, Delgais, Guiseppe, Abbate, Giancarlo

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Optical Anisotropy and Charge-Transfer Transition Energies in BiFeO3 from 1.0 to 5.5 eV von Choi, S. G., Yi, H. T., Cheong, S. W., Hilfiker, J. N., France, R., Norman, A. G.

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In-situ ellipsometric characterization of the electrodeposition of metal films von Hilfiker, James N., Thompson, Daniel W., Hale, Jeffrey S., Woollam, John A.

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Electronic and optical properties of Ta1−xZrxN films: Experimental and ab initio studies von Aouadi, S. M., Bohnhoff, A., Amriou, T., Haasch, R. T., Williams, M., Hilfiker, J. N.

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Long-wavelength cutoff filters of a new type von Dobrowolski, J A, Li, L, Hilfiker, J N

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Growth and characterization of large area Cu(In, Ga)Se2 films von HERMANN, A. M, GONZALEZ, C, RAMAKRISHNAN, P. A, BALZAR, D, MARSHALL, C. H, HILFIKER, J. N, TIWALD, T

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Thin-film metrology of silicon-on-insulator materials von Zollner, S., Lee, T.-C., Noehring, K., Konkar, A., Theodore, N. D., Huang, W. M., Monk, D., Wetteroth, T., Wilson, S. R., Hilfiker, J. N.

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Deposition factors and band gap of zinc-blende AlN von Thompson, Margarita P., Auner, Gregory W., Zheleva, Tsvetanka S., Jones, Kenneth A., Simko, Steven J., Hilfiker, James N.

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Materials Characterization in the Vacuum Ultraviolet with Variable Angle Spectroscopic Ellipsometry von Wagner, T., Hilfiker, J.N., Tiwald, T.E., Bungay, C.L., Zollner, S.

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