Ultrafast spatiotemporal photocarrier dynamics near GaN surfaces studied by terahertz emission spectroscopy von Yamahara, Kota, Mannan, Abdul, Kawayama, Iwao, Nakanishi, Hidetoshi, Tonouchi, Masayoshi

Volltext

Probing the surface potential of oxidized silicon by assessing terahertz emission von Mochizuki, Toshimitsu, Ito, Akira, Mitchell, Jonathon, Nakanishi, Hidetoshi, Tanahashi, Katsuto, Kawayama, Iwao, Tonouchi, Masayoshi, Shirasawa, Katsuhiko, Takato, Hidetaka

Volltext

Probing the surface potential of SiO2/4H-SiC(0001) by terahertz emission spectroscopy von Nakanishi, Hidetoshi, Nishimura, Tatsuhiko, Kawayama, Iwao, Tonouchi, Masayoshi, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji

Volltext

Visualization of GaN surface potential using terahertz emission enhanced by local defects von Sakai, Yuji, Kawayama, Iwao, Nakanishi, Hidetoshi, Tonouchi, Masayoshi

Volltext

Control of dipole properties in high-k and SiO2 stacks on Si substrates with tricolor superstructure von Hotta, Yasushi, Kawayama, Iwao, Miyake, Shozo, Saiki, Ikuya, Nishi, Shintaro, Yamahara, Kota, Arafune, Koji, Yoshida, Haruhiko, Satoh, Shin-ichi, Sawamoto, Naomi, Ogura, Atsushi, Ito, Akira, Nakanishi, Hidetoshi, Tonouchi, Masayoshi, Tabata, Hitoshi

Volltext

Polarization imaging of imperfect m-plane GaN surfaces von Sakai, Yuji, Kawayama, Iwao, Nakanishi, Hidetoshi, Tonouchi, Masayoshi

Volltext

Imaging of a Polycrystalline Silicon Solar Cell Using a Laser Terahertz Emission Microscope von Nakanishi, Hidetoshi, Fujiwara, Shogo, Takayama, Kazuhisa, Kawayama, Iwao, Murakami, Hironaru, Tonouchi, Masayoshi

Volltext

Terahertz Emission Spectroscopy and Microscopy on Ultrawide Bandgap Semiconductor β-Ga2O3 von Jiang, Hao, Gong, Chen, Nishimura, Tatsuhiko, Murakami, Hironaru, Kawayama, Iwao, Nakanishi, Hidetoshi, Tonouchi, Masayoshi

Volltext

Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell von Nakanishi, Hidetoshi, Ito, Akira, Takayama, Kazuhisa, Kawayama, Iwao, Murakami, Hironaru, Tonouchi, Masayoshi

Volltext

Visualization of Photoexcited Carrier Responses in a Solar Cell Using Optical Pump—Terahertz Emission Probe Technique von Nakanishi, Hidetoshi, Ito, Akira, Takayama, Kazuhisa, Kawayama, Iwao, Murakami, Hironaru, Tonouchi, Masayoshi

Volltext

Potential evaluation of grinding surface of Si wafers using a Laser Terahertz Emission Microscope von Nakanishi, Hidetoshi, Nishimura, Tatsuhiko, Ito, Akira, Fujita, Katsuya

Volltext

A Biomechanical Analysis of Seoi-nage : A Kinematic Comparison Between Expert and Non-Expert Levels von Naoki, ITAMI, Hiroshi, YAMADA, Hideyuki, NAGAO, Seiji, MIYAZAKI, Hidetoshi, NAKANISHI, Kenichiro, AGEMIZU, Kosei, INOUE, Ryunosuke, HAGA, Keita, OGAWARA, Misaki, ITEYA

Volltext

Terahertz Wave Radiation from Fullerene (C60) by Femtosecond Laser Irradiation von Nakanishi, Hidetoshi, Fujita, Katsuya, Mizubata, Minoru

Volltext

A study on mechanisms of laser THz emission at MOS interface - Separation of the surface electric field and the photo-Dember effect von Nishimura, Tatsuhiko, Nakanishi, Hidetoshi, Kawayama, Iwao, Tonouchi, Masayoshi, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji

Volltext

Characterization of 4H-SiC wafer using a Laser Terahertz Emission Microscope at 400 nm von Nishimura, Tatsuhiko, Nakanishi, Hidetoshi, Kawayama, Iwao, Tonouchi, Masayoshi, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji

Volltext

Operando measurement of hetero-interface potential distribution in GaN-HEMT using a Laser Terahertz Emission Microscope von Takahashi, Tokio, Nishimura, Tatsuhiko, Nakanishi, Hidetoshi, Kawayama, Iwao, Tonouchi, Masayoshi, Shimizu, Mitsuaki, Takada, Noriyuki

Volltext

Evaluation of the surface potential of oxidized silicon carbide by a Laser Terahertz Emission Microscope von Nishimura, Tatsuhiko, Nakanishi, Hidetoshi, Kawayama, Iwao, Tonouchi, Masayoshi, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji

Volltext

Characteristics of terahertz emissions from nitride semiconductor heterostructures von Yamahara, Kota, Mannan, Abdul, Serita, Kazunori, Murakami, Hironaru, Nakanishi, Hidetoshi, Higashiwaki, Masataka, Tonouchi, Masayoshi, Kawayama, Iwao

Volltext

Evaluation of passivation of oxidized Si using LTEM and corona charging von Mochizuki, Toshimitsu, Ito, Akira, Tanahashi, Katsuto, Nakanishi, Hidetoshi, Kawayama, Iwao, Tonouchi, Masayoshi, Shirasawa, Katsuhiko, Takato, Hidetaka

Volltext

Evaluation of SiO2/SiC interface using a Laser Terahertz Emission Microscope von Nishimura, Tatsuhiko, Nakanishi, Hidetoshi, Kawayama, Iwao, Tonouchi, Masayoshi, Hosoi, Takuji, Shimura, Takayoshi, Watanabe, Heiji

Volltext