Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications von Kuhne, Philipp, Armakavicius, Nerijus, Stanishev, Vallery, Herzinger, Craig M., Schubert, Mathias, Darakchieva, Vanya

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Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument von Kühne, P, Herzinger, C M, Schubert, M, Woollam, J A, Hofmann, T

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Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures von Hofmann, T., Kühne, P., Schöche, S., Chen, Jr-Tai, Forsberg, U., Janzén, E., Ben Sedrine, N., Herzinger, C. M., Woollam, J. A., Schubert, M., Darakchieva, V.

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Infrared dielectric anisotropy and phonon modes of sapphire von Schubert, M., Tiwald, T. E., Herzinger, C. M.

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Variable-wavelength frequency-domain terahertz ellipsometry von Hofmann, T., Herzinger, C. M., Boosalis, A., Tiwald, T. E., Woollam, J. A., Schubert, M.

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Terahertz ellipsometry and terahertz optical-Hall effect von Hofmann, T., Herzinger, C.M., Tedesco, J.L., Gaskill, D.K., Woollam, J.A., Schubert, M.

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On the nature of superconductivity in the anisotropic dichalcogenide NbSe2{CoCp2}x von Scheidt, E-W, Herzinger, M, Fischer, A, Schmitz, D, Reiners, J, Mayr, F, Loder, F, Baenitz, M, Scherer, W

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Mueller matrix imaging microscope using dual continuously rotating anisotropic mirrors von Ruder, Alexander, Wright, Brandon, Feder, Rene, Kilic, Ufuk, Hilfiker, Matthew, Schubert, Eva, Herzinger, Craig M., Schubert, Mathias

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Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation von Herzinger, C. M., Johs, B., McGahan, W. A., Woollam, J. A., Paulson, W.

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Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect von Kühne, P, Darakchieva, V, Yakimova, R, Tedesco, J D, Myers-Ward, R L, Eddy, Jr, C R, Gaskill, D K, Herzinger, C M, Woollam, J A, Schubert, M, Hofmann, T

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Terahertz optical-Hall effect for multiple valley band materials: n-type silicon von Kühne, P., Hofmann, T., Herzinger, C.M., Schubert, M.

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Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-ty... von Schubert, Mathias, Hofmann, Tino, Herzinger, Craig M

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The optical Hall effect von Hofmann, T., Herzinger, C. M., Krahmer, C., Streubel, K., Schubert, M.

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Mueller matrix ellipsometer using dual continuously rotating anisotropic mirrors von Ruder, Alexander, Wright, Brandon, Peev, Darin, Feder, Rene, Kilic, Ufuk, Hilfiker, Matthew, Schubert, Eva, Herzinger, Craig M., Schubert, Mathias

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Terahertz-frequency dielectric anisotropy in three-dimensional polymethacrylates fabricated by stereolithography von Park, S, Li, Y, Fullager, D B, Schöche, S, Herzinger, C M, Lee, S, Hofmann, T

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Terahertz to Mid-infrared Dielectric Properties of Polymethacrylates for Stereolithographic Single Layer Assembly von Park, Serang, Li, Yanzeng, Fullager, Daniel B., Schöche, Stefan, Herzinger, Craig M., Boreman, Glenn D., Hofmann, Tino

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Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry von Hofmann, T., Boosalis, A., Kühne, P., Herzinger, C. M., Woollam, J. A., Gaskill, D. K., Tedesco, J. L., Schubert, M.

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Influence of competing energy scales on the effective spin degeneracy in CeNi9−xFexGe4 von Gold, C., Uffinger, M., Herzinger, M., Eickerling, G., Scherer, W., Michor, H., Scheidt, E.-W.

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Quantifying the accuracy of ellipsometer systems von Johs, Blaine, Herzinger, C. M.

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Anisotropic contrast optical microscope von Peev, D., Hofmann, T., Kananizadeh, N., Beeram, S., Rodriguez, E., Wimer, S., Rodenhausen, K. B., Herzinger, C. M., Kasputis, T., Pfaunmiller, E., Nguyen, A., Korlacki, R., Pannier, A., Li, Y., Schubert, E., Hage, D., Schubert, M.

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