Metallic Seed Nanolayers for Enhanced Nucleation of Nanocrystalline Diamond Thin Films von Buijnsters, Josephus G, Celis, Jean-Pierre, Hendrikx, Ruud W. A, Vázquez, Luis

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Revisiting the Electrochemical Nitrogen Reduction on Molybdenum and Iron Carbides: Promising Catalysts or False Positives? von Izelaar, Boaz, Ripepi, Davide, Asperti, Simone, Dugulan, A. Iulian, Hendrikx, Ruud W.A., Böttger, Amarante J., Mulder, Fokko M., Kortlever, Ruud

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Thickness dependent terahertz emission from cobalt thin films von Kumar, Nishant, Hendrikx, Ruud W A, Adam, Aurèle J L, Planken, Paul C M

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Enhanced terahertz emission by coherent optical absorption in ultrathin semiconductor films on metals von Ramakrishnan, Gopakumar, Ramanandan, Gopika K P, Adam, Aurèle J L, Xu, Man, Kumar, Nishant, Hendrikx, Ruud W A, Planken, Paul C M

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Plasmon-enhanced terahertz emission from a semiconductor/metal interface von Ramakrishnan, Gopakumar, Kumar, Nishant, Ramanandan, Gopika K. P., Adam, Aurèle J. L., Hendrikx, Ruud W. A., Planken, Paul C. M.

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Experimental screening of intermetallic alloys for electrochemical CO2 reduction von van den Berg, Daniël, Brouwer, Johannes C., Hendrikx, Ruud W.A., Kortlever, Ruud

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Smoothing of X-ray diffraction data and K α 2 elimination using penalized likelihood and the composite link model von de Rooi, Johan J., van der Pers, Niek M., Hendrikx, Ruud W. A., Delhez, Rob, Böttger, Amarante J., Eilers, Paul H. C.

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A multi-analytical approach reveals flexible compound adhesive technology at Steenbokfontein Cave, Western Cape von Aleo, Alessandro, Jerardino, Antonieta, Chasan, Rivka, Despotopoulou, Myrto, Ngan-Tillard, Dominique J.M., Hendrikx, Ruud W.A., Langejans, Geeske H.J.

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Testing non-destructive spectrometric methods for the identification and distinction of archaeological pine wood tar and birch bark tar von Despotopoulou, Myrto, Langejans, Geeske H.J., Hendrikx, Ruud W.A., Joosten, Ineke, Nijemeisland, Marlies, Poulis, Johannes A., Kozowyk, Paul R.B.

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Smoothing of X-ray diffraction data and Kα2 elimination using penalized likelihood and the composite link model von de Rooi, Johan J., van der Pers, Niek M., Hendrikx, Ruud W. A., Delhez, Rob, Böttger, Amarante J., Eilers, Paul H. C.

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Smoothing of X-ray diffraction data and K[alpha]2 elimination using penalized likelihood and the composite link model von de Rooi, Johan J, van der Pers, Niek M, Hendrikx, Ruud W A, Delhez, Rob, Bottger, Amarante J, Eilers, Paul H C

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