Air-channel fabrication for microelectromechanical systems via sacrificial photosensitive polycarbonates von Jayachandran, J.P., Reed, H.A., Hongshi Zhen, Rhodes, L.F., Henderson, C.L., Allen, S.A.B., Kohl, P.A.

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A systematic review of drug-induced subacute cutaneous lupus erythematosus von Lowe, G., Henderson, C.L., Grau, R.H., Hansen, C.B., Sontheimer, R.D.

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A systematic review of drug-induced subacute cutaneous lupus erythematosus: Systematic review of drug-induced SCLE von Lowe, G., Henderson, C.L., Grau, R.H., Hansen, C.B., Sontheimer, R.D.

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Effect of norgestomet or nongestomet and gonadotropin-releasing hormone on attainment of puberty in beef heifers von Henderson, C.L, Miller, H.L

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Signature analysis for IC diagnosis and failure analysis von Henderson, C.L., Soden, J.M.

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Electrochemical membranes : transport limitations for absorbed gases von FORNEY, L. J, HENDERSON, C. L

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Integrated mixed-signal optoelectronic system-on-a-chip sensor von Kim, D.D., Thomas, M.A., Lillie, J.J., Dennis, K.S., Comeau, B.M., Brooke, M.A., Jokerst, N.M., Ralph, S.E., Henderson, C.L.

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Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects von Cole, E.I., Soden, J.M., Tangyunyong, P., Candelaria, P.L., Beegle, R.W., Barton, D.L., Henderson, C.L., Hawkins, C.F.

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IC diagnosis: industry issues von Soden, J.M., Henderson, C.L.

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A mutant of Mycoplasma mycoides subsp. mycoides lacking the H 2 O 2 -producing enzyme l-α-glycerophosphate oxidase von Wadher, B.J., Henderson, C.L., Miles, R.J., Varsani, H.

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A mutant of Mycoplasma mycoides subsp. mycoides lacking the H 2O 2-producing enzyme l-α-glycerophosphate oxidase von Wadher, B.J., Henderson, C.L., Miles, R.J., Varsani, H.

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A mutant of Mycoplasma mycoides subsp. mycoides lacking the H2O2‐producing enzyme l‐α‐glycerophosphate oxidase von Wadher, B.J., Henderson, C.L., Miles, R.J., Varsani, H.

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IC failure analysis tools and techniques-magic, mystery, and science von Soden, J.M., Anderson, R.E., Henderson, C.L.

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Economic Impact of Type I Test Errors at System and Board Levels von Henderson, C.L., Williams, R.H., Hawkins, C.F.

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THE BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS von Henderson, C.L., Soden, J.M., Hawkins, C.F.

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An interferometric sensor for integration with Si CMOS signal processing circuitry: "Sensor on a chip" von Thomas, M.A., Lillie, J., Dae-Ik Kim, Ralph, S., Jokerst, N.M., Brooke, M., Dennis, K., Comeau, B., Henderson, C.L.

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Novel failure analysis techniques using photon probing with a scanning optical microscope von Cole, E.I., Soden, J.M., Rife, J.L., Barton, D.L., Henderson, C.L.

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IC failure analysis: magic, mystery, and science von Soden, J.M., Anderson, R.E., Henderson, C.L.

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Observations of the disturbed region around an ionospheric spacecraft von Henderson, C.L., Samir, U.

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The advent of failure analysis software technology von Henderson, C.L., Barnard, R.D.

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