Nanometer-resolution scanning Auger electron microscopy von Hembree, G.G., Venables, J.A.

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High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst von Liu, J., Hembree, G.G., Spinnler, G.E., Venables, J.A.

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Certification of NIST SRM 1961: 30-micrometer diameter polystyrene spheres von Hartman, A.W., Doiron, T.D., Hembree, G.G.

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Nanometer-resolution surface analysis with Auger electrons von Liu, J., Hembree, G.G., Spinnler, G.E., Venables, J.A.

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Biassed secondary electron imaging in a UHV-STEM von Hembree, G.G., Crozier, P.A., Drucker, J.S., Krishnamurthy, M., Venables, J.A., Cowley, J.M.

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Certification of SRM 1960 - Nominal 10 micrometer diameter polystyrene spheres (space beads) von Lettieri, T.R., Hartman, A.W., Hembree, G.G., Marx, E.

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Short And Long-Range Magnetic Ordering In Ultra-Thin Co/Cu[100] Films von Coyle, S.T., Hembree, G.G., Scheinfein, M.R.

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Improved instrument for medium energy electron diffraction and microscopy of surfaces von Elibol, C., Ou, H.‐J., Hembree, G. G., Cowley, J. M.

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Development of a one-micrometer-diameter particle size Standard Reference Material von Mulholland, G.W., Hartman, A.W., Hembree, G.G., Marx, E., Lettieri, T.R.

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