Ultrawide‐Bandgap Semiconductors: Research Opportunities and Challenges von Tsao, J. Y., Chowdhury, S., Hollis, M. A., Jena, D., Johnson, N. M., Jones, K. A., Kaplar, R. J., Rajan, S., Van de Walle, C. G., Bellotti, E., Chua, C. L., Collazo, R., Coltrin, M. E., Cooper, J. A., Evans, K. R., Graham, S., Grotjohn, T. A., Heller, E. R., Higashiwaki, M., Islam, M. S., Juodawlkis, P. W., Khan, M. A., Koehler, A. D., Leach, J. H., Mishra, U. K., Nemanich, R. J., Pilawa‐Podgurski, R. C. N., Shealy, J. B., Sitar, Z., Tadjer, M. J., Witulski, A. F., Wraback, M., Simmons, J. A.

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Monitoring the Joule heating profile of GaN/SiC high electron mobility transistors via cross-sectional thermal imaging von Pavlidis, G., Hilton, A. M., Brown, J. L., Heller, E. R., Graham, S.

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The No Surprises Act: What Neuroradiologists Should Know von Nguyen, T H, Heller, R E, Keysor, K, Milburn, J M, Rula, E Y, Spangler, R, Hirsch, J A

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Measurements of an AC-LGAD strip sensor with a 120 GeV proton beam von Apresyan, A., Chen, W., D'Amen, G., Di Petrillo, K. F., Giacomini, G., Heller, R. E., Lee, H., Moon, C-S, Tricoli, A.

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Electro-thermal modeling of multifinger AlGaN/GaN HEMT device operation including thermal substrate effects von Heller, E.R., Crespo, A.

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Local trap spectroscopy on cross-sectioned AlGaN/GaN devices with in situ biasing von Gleason, D. A., Galiano, K., Brown, J. L., Hilton, A. M., Ringel, S. A., Arehart, A. R., Heller, E. R., Dorsey, D. L., Pelz, J. P.

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Direct measurement of defect and dopant abruptness at high electron mobility ZnO homojunctions von Foster, G. M., Faber, G., Yao, Y.-F., Yang, C. C., Heller, E. R., Look, D. C., Brillson, L. J.

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High-quality InAsyP1−y step-graded buffer by molecular-beam epitaxy von Hudait, M. K., Lin, Y., Wilt, D. M., Speck, J. S., Tivarus, C. A., Heller, E. R., Pelz, J. P., Ringel, S. A.

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Thermometry of AlGaN/GaN HEMTs Using Multispectral Raman Features von Sukwon Choi, Heller, E. R., Dorsey, D., Vetury, R., Graham, S.

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The Impact of Bias Conditions on Self-Heating in AlGaN/GaN HEMTs von Sukwon Choi, Heller, E. R., Dorsey, D., Vetury, R., Graham, S.

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Hippocampal markers of age-related memory dysfunction: Behavioral, electrophysiological and morphological perspectives von Geinisman, Yuri, Detoledo-Morrell, Leyla, Morrell, Frank, Heller, Richard E.

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Short-Channel Effect Limitations on High-Frequency Operation of AlGaN/GaN HEMTs for T-Gate Devices von Jessen, G.H., Fitch, R.C., Gillespie, J.K., Via, G., Crespo, A., Langley, D., Denninghoff, D.J., Trejo, M., Heller, E.R.

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Two apparent suprarenal masses. Two cases in children: heterotaxy syndrome with spleen lying in suprarenal space and gastric duplication cyst lying in suprarenal space von Heller, R E, Fernbach, S K

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Direct observation of 0.57 eV trap-related RF output power reduction in AlGaN/GaN high electron mobility transistors von Arehart, A.R., Sasikumar, A., Rajan, S., Via, G.D., Poling, B., Winningham, B., Heller, E.R., Brown, D., Pei, Y., Recht, F., Mishra, U.K., Ringel, S.A.

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Observation of a scanning tunneling microscopy induced photocurrent during ballistic electron emission microscopy von Heller, E. R., Pelz, J. P.

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The spectrum of practice in the diagnosis and management of pneumonia in patients requiring mechanical ventilation. Australian and New Zealand practice in intensive care (ANZPIC II... von BOOTS, R. J, LIPMAN, J, BELLOMO, R, STEPHENS, D, HELLER, R. F

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Simulation of Life Testing Procedures for Estimating Long-Term Degradation and Lifetime of AlGaN/GaN HEMTs von Heller, E.R.

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Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN von Arehart, A.R., Sasikumar, A., Via, G.D., Poling, B., Heller, E.R., Ringel, S.A.

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Structural synaptic correlate of long-term potentiation: Formation of axospinous synapses with multiple, completely partitioned transmission zones von Geinisman, Yuri, Detoledo-Morrell, Leyla, Morrell, Frank, Heller, Richard E., Rossi, Marvin, Parshall, Robert F.

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Development of a Versatile Physics-Based Finite-Element Model of an AlGaN/GaN HEMT Capable of Accommodating Process and Epitaxy Variations and Calibrated Using Multiple DC Paramete... von Heller, E R, Vetury, R, Green, D S

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