Metallurgy of high strength Ni–Mn microsystems fabricated by electrodeposition von Yang, N.Y.C, Headley, T.J, Kelly, J.J, Hruby, J.M

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Arsenic ion implant energy effects on CMOS gate oxide hardness von Draper, B.L., Shaneyfelt, M.R., Young, R.W., Headley, T.J., Dondero, R.

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High-resolution transmission electron microscopy calibration of critical dimension (CD) reference materials von Allen, R.A., Headley, T.J., Everist, S.C., Ghoshtagore, R.N., Cresswell, M.W., Linholm, L.W.

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Test structures for referencing electrical linewidth measurements to silicon lattice parameters using HRTEM von Allen, R.A., am Ende, B.A., Cresswell, M.W., Murabito, C.E., Headley, T.J., Guthrie, W.F., Linholm, L.W., Ellenwood, C.H., Bogardus, E.H.

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Crystallization of a Glass-Ceramic by Epitaxial Growth von HEADLEY, T.J., LOEHMAN, R.E.

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Residual carbon from pulverized-coal-fired boilers. 2. Morphology and physicochemical properties von Hurt, Robert H., Davis, Kevin A., Yang, Nancy Y.C., Headley, Thomas J., Mitchell, Gareth D.

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“Ultramicroporous” silica-based supported inorganic membranes von Brinker, C.J., Ward, T.L., Sehgal, R., Raman, N.K., Hietala, S.L., Smith, D.M., Hua, D.-W., Headley, T.J.

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Highly reflective, long wavelength AlAsSb/GaAsSb distributed Bragg reflector grown by molecular beam epitaxy on InP substrates von Blum, O., Fritz, I. J., Dawson, L. R., Howard, A. J., Headley, T. J., Klem, J. F., Drummond, T. J.

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Microstructural properties of helium implanted void layers in silicon as related to front-side gettering von MEDERNACH, J. W, HILL, T. A, MYERS, S. M, HEADLEY, T. J

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Metal gettering by boron-silicide precipitates in boron-implanted silicon von Myers, S.M., Petersen, G.A., Headley, T.J., Michael, J.R., Aselage, T.L., Seager, C.H.

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Nondestructive measurement of porous silicon thickness using X-ray reflectivity von GUILINGER, T. R, KELLY, M. J, CHASON, E. H, HEADLEY, T. J, HOWARD, A. J

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Strong segregation gettering of transition metals by implantation-formed cavities and boron-silicide precipitates in silicon von Myers, S.M., Petersen, G.A., Follstaedt, D.M., Headley, T.J., Michael, J.R., Seager, C.H.

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Dislocation substructures formed during the flow stress recovery of high purity aluminum von Young, C.T., Headley, T.J., Lytton, J.L.

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Ion-implanted hydrogen in gallium nitride von Myers, S.M, Han, J, Headley, T.J, Hills, C.R, Petersen, G.A, Seager, C.H, Wampler, W.R

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Surface and near-surface structure in carbon microcellular materials produced from organic aerogels and xerogels von Even, Wm.R., Crocker, R.W., Hunter, M.C., Yang, N.C., Headley, T.J.

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La0.5Sr0.5CoO3 electrode technology for Pb(Zr,Ti)O3 thin film nonvolatile memories von Tuttle, B.A., Al-Shareef, H.N., Warren, W.L., Raymond, M.V., Headley, T.J., Voigt, J.A., Evans, J., Ramesh, R.

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Catalyst dispersion on supported ultramicroporous inorganic membranes using derivatized silylation agents von Raman, N.K., Ward, T.L., Brinker, C.J., Sehgal, R., Smith, D.M., Duan, Z., Hampden-Smith, M., Bailey, J.K., Headley, T.J.

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Phase stability and properties of near-equilibrium TlCaBaCuO superconductors von Aselage, T.L., Venturini, E.L., Van Deusen, S.B., Headley, T.J., Eatough, M.O., Voigt, J.A.

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La 0.5Sr 0.5CoO 3 electrode technology for Pb(Zr,Ti)O 3 thin film nonvolatile memories von Tuttle, B.A., Al-Shareef, H.N., Warren, W.L., Raymond, M.V., Headley, T.J., Voigt, J.A., Evans, J., Ramesh, R.

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Highly oriented, chemically prepared Pb(Zr,Ti)O[sub 3] thin films von Tuttle, B.A., Voigt, J.A., Goodnow, D.C., Lamppa, D.L., Headley, T.J., Eatough, M.O., Zender, G., Nasby, R.D., Rodgers, S.M.

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