Crystallite size distribution by two-dimensional XRD von He, Bob B.

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Geometry and algorithms to expand 2θ coverage of a 2D detector von He, Bob B.

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Materials characterization from diffraction intensity distribution in the γ-direction von He, Bob B.

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Measurement of Residual Stresses in Thin Films by Two-Dimensional XRD von He, Bob B.

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XRD2 Stress Measurement for Samples with Texture and Large Grains von He, Bob B.

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XRD super(2) Stress Measurement for Samples with Texture and Large Grains von He, Bob B

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Materials characterization from diffraction intensity distribution in the [gamma]-direction von He, Bob B

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Gamma Profile Analysis for Stress, Texture and Grain Size von He, Bob B.

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Recent Advances in Texture Measurement Using Two-Dimensional Detector von He, Bob B.

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MicroGap Area Detector for Stress and Texture Analysis von He, Bob B.

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Stress and Texture Analysis with Two-Dimensional X-Ray Diffraction von Preckwinkel, Uwe, He, Bob B., Smith, Kingsley L.

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Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis von Huang, Ping, He, Bob B., Wang, Fei, Xu, Ke Wei

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An Investigation of Residual Stress of Porous Titania Layer by Micro-Arc Oxidation under Different Voltages von Huang, Ping, He, Bob B., Xu, Ke Wei, Han, Yong

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Method for measuring crystallite size with a two-dimensional X-ray diffractometer von He, Bob B

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Gage R&R Study on Residual Stress Measurement System with Area Detector von schultz, Willard, He, Bob B., Smith, Kingsley L., Preckwinkel, Uwe

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Suppressing quantum errors by scaling a surface code logical qubit von Acharya, Rajeev, Aleiner, Igor, Allen, Richard, Andersen, Trond I., Ansmann, Markus, Arute, Frank, Arya, Kunal, Asfaw, Abraham, Atalaya, Juan, Babbush, Ryan, Bacon, Dave, Bardin, Joseph C., Basso, Joao, Bengtsson, Andreas, Boixo, Sergio, Bortoli, Gina, Bourassa, Alexandre, Bovaird, Jenna, Brill, Leon, Broughton, Michael, Buckley, Bob B., Buell, David A., Burger, Tim, Burkett, Brian, Bushnell, Nicholas, Chen, Yu, Chen, Zijun, Chiaro, Ben, Cogan, Josh, Collins, Roberto, Conner, Paul, Courtney, William, Crook, Alexander L., Curtin, Ben, Debroy, Dripto M., Del Toro Barba, Alexander, Demura, Sean, Dunsworth, Andrew, Eppens, Daniel, Erickson, Catherine, Faoro, Lara, Farhi, Edward, Fatemi, Reza, Flores Burgos, Leslie, Forati, Ebrahim, Fowler, Austin G., Foxen, Brooks, Giang, William, Gidney, Craig, Gilboa, Dar, Giustina, Marissa, Grajales Dau, Alejandro, Gross, Jonathan A., Habegger, Steve, Hamilton, Michael C., Harrigan, Matthew P., Harrington, Sean D., Higgott, Oscar, Hilton, Jeremy, Hoffmann, Markus, Hong, Sabrina, Huang, Trent, Huff, Ashley, Huggins, William J., Ioffe, Lev B., Isakov, Sergei V., Iveland, Justin, Jeffrey, Evan, Jiang, Zhang, Jones, Cody, Juhas, Pavol, Kafri, Dvir, Kechedzhi, Kostyantyn, Kelly, Julian, Khattar, Tanuj, Khezri, Mostafa, Kieferová, Mária, Kim, Seon, Kitaev, Alexei, Klimov, Paul V., Klots, Andrey R., Korotkov, Alexander N., Kostritsa, Fedor, Kreikebaum, John Mark, Landhuis, David, Laptev, Pavel, Lau, Kim-Ming, Laws, Lily, Lee, Joonho, Lee, Kenny, Lester, Brian J., Lill, Alexander, Liu, Wayne, Locharla, Aditya, Lucero, Erik, Malone, Fionn D., Marshall, Jeffrey, Martin, Orion, McClean, Jarrod R., McCourt, Trevor

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X-ray diffractometer having co-exiting stages optimized for single crystal and bulk diffraction von He, Bob B, Schwarz, Gerald T

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Handheld two-dimensional X-ray diffractometer von He, Bob B, Durst, Roger D

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Micro-Area Residual Stress Measurement Using a Two-Dimensional Detector von schultz, Willard, He, Bob B., Smith, Kingsley L., Preckwinkel, Uwe

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Quantum error correction below the surface code threshold von Acharya, Rajeev, Abanin, Dmitry A., Aghababaie-Beni, Laleh, Aleiner, Igor, Andersen, Trond I., Ansmann, Markus, Arute, Frank, Arya, Kunal, Asfaw, Abraham, Astrakhantsev, Nikita, Atalaya, Juan, Babbush, Ryan, Bacon, Dave, Ballard, Brian, Bardin, Joseph C., Bausch, Johannes, Bengtsson, Andreas, Bilmes, Alexander, Blackwell, Sam, Boixo, Sergio, Bortoli, Gina, Bourassa, Alexandre, Bovaird, Jenna, Brill, Leon, Broughton, Michael, Browne, David A., Buchea, Brett, Buckley, Bob B., Buell, David A., Burger, Tim, Burkett, Brian, Bushnell, Nicholas, Cabrera, Anthony, Campero, Juan, Chang, Hung-Shen, Chen, Yu, Chen, Zijun, Chiaro, Ben, Chik, Desmond, Chou, Charina, Claes, Jahan, Cleland, Agnetta Y., Cogan, Josh, Collins, Roberto, Conner, Paul, Courtney, William, Crook, Alexander L., Curtin, Ben, Das, Sayan, Davies, Alex, De Lorenzo, Laura, Debroy, Dripto M., Demura, Sean, Devoret, Michel, Di Paolo, Agustin, Donohoe, Paul, Drozdov, Ilya, Dunsworth, Andrew, Earle, Clint, Edlich, Thomas, Eickbusch, Alec, Elbag, Aviv Moshe, Elzouka, Mahmoud, Erickson, Catherine, Faoro, Lara, Farhi, Edward, Ferreira, Vinicius S., Burgos, Leslie Flores, Forati, Ebrahim, Fowler, Austin G., Foxen, Brooks, Ganjam, Suhas, Garcia, Gonzalo, Gasca, Robert, Genois, Élie, Giang, William, Gidney, Craig, Gilboa, Dar, Gosula, Raja, Dau, Alejandro Grajales, Graumann, Dietrich, Greene, Alex, Gross, Jonathan A., Habegger, Steve, Hall, John, Hamilton, Michael C., Hansen, Monica, Harrigan, Matthew P., Harrington, Sean D., Heras, Francisco J. H., Heslin, Stephen, Heu, Paula, Higgott, Oscar, Hill, Gordon, Hilton, Jeremy, Holland, George, Hong, Sabrina, Huang, Hsin-Yuan, Huff, Ashley, Huggins, William J.

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