A rotating-compensator fourier ellipsometer von Hauge, P.S., Dill, F.H.

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Conventions and formulas for using the Mueller-Stokes calculus in ellipsometry von Hauge, P.S., Muller, R.H., Smith, C.G.

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Microwave measurement of the velocity-field characteristic of GaAs von Braslau, N., Hauge, P.S.

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Generation of performance constraints for layout von Nair, R., Berman, C.L., Hauge, P.S., Yoffa, E.J.

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Recent developments in instrumentation in ellipsometry von Hauge, P.S.

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Characterization of positive photoresist von Dill, F.H., Hornberger, W.P., Hauge, P.S., Shaw, J.M.

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Recent developments in instrumentation in ellipsometry von Hauge, P.S.

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ACORN: A Local Customization Approach to DCVS Physical Design von Yoffa, E.J., Hauge, P.S.

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Generalized rotating-compensator ellipsometry von Hauge, P.S.

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Automated Mueller matrix ellipsometry von Hauge, P.S.

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Vanguard: A Chip Physical Design System von Hauge, P.S., Yoffa, E.J.

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Recoil corrections for single-nucleon transfer reactions von Hauge, Paul S.

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Exact first-order recoil for S-wave single-nucleon transfer reactions von Hauge, Paul S.

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Static negative resistance in Gunn effect materials with field-dependent carrier diffusion von Hauge, P.S.

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A Method for Improving Cascode-Switch Macro Wirability von Schlag, M.D.F., Yoffa, E.J., Hauge, P.S., Wong, C.K.

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Domain velocity in semiconductors with field-dependent carrier diffusion von Hauge, P.S.

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Conventions and formulas for using the mueller-stokes calculus in ellipsometry von Hauge, P.S., Muller, R.H., Smith, C.G.

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Dual-Mode Reflectometer for Measuring Microwave Magnetic Kerr Effect in Semiconductors von Hauge, P.S., Champlin, K.S.

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Contributors, July, 1967 von Baird, J.R., Champlin, K.S., Garver, R.V., Hauge, P.S., Ting Hei Mak, Moore, R.A., Sharpe, C.B., Wait, J.R., Webb, D.C., Yamashita, E.

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