Chip-Backside Vulnerability to Intentional Electromagnetic Interference in Integrated Circuits von Wadatsumi, Takuya, Monta, Kazuki, Hayashi, Yusuke, Miki, Takuji, Hatzopoulos, Alkis A., Baric, Adrijan, Nagata, Makoto

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Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits von Spyronasios, A D, Dimopoulos, M G, Hatzopoulos, A A

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A Unified Method for Calculating Capacitive and Resistive Coupling Exploiting Geometry Constraints on Lightly and Heavily Doped CMOS Processes von Bontzios, Yiorgos I, Hatzopoulos, Alkis A

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An Improved Optical Feedback Pixel Driver Circuit von Papadopoulos, N.P., Hatzopoulos, A.A., Papakostas, D.K.

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A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI von Bontzios, Y. I., Dimopoulos, M. G., Hatzopoulos, A. A.

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An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images von Bontzios, Yiorgos I., Dimopoulos, Michael G., Hatzopoulos, Alkis A.

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Circuit Implementation of a Supply Current Spectrum Test Method von Dimopoulos, M G, Spyronasios, A D, Papakostas, D K, Konstantinou, D K, Hatzopoulos, A A

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Current-Based Testing of Optical Feedback Pixel Driver von Papadopoulos, N.P., Papakostas, D.K., Hatzopoulos, A.A.

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Resolving differences of parameter extraction methods for integrated inductor design and model validation von Hatzopoulos, Alkis A., Stefanou, Stefanos, Gielen, Georges, Schreurs, Dominique

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A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum von Papakostas, D.K., Hatzopoulos, A.A.

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Correlation-based comparison of analog signatures for identification and fault diagnosis von Papakostas, D.K., Hatzopoulos, A.A.

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Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits von Bontzios, Yiorgos I., Dimopoulos, Michael G., Hatzopoulos, Alkis A.

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A complete scheme of built-in self-test (BIST) structure for Fault diagnosis in analog circuits and systems von HATZOPOULOS, A. A, SISKOS, S, KONTOLEON, J. M

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CMOS Inductor Performance Estimation using Z- and S-parameters von Drakaki, Maria, Hatzopoulos, Alkis A., Siskos, Stylianos

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A Light-Impact Model for p-Type and n-Type Poly-Si TFTs von Papadopoulos, N.P., Hatzopoulos, A.A., Papakostas, D.K., Picos, R., Dimitriadis, C.A., Siskos, S.

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Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits von Tsatsoulis, Nikolaos A., Bontzios, Yiorgos I., Dimopoulos, Michael G., Hatzopoulos, Alkis A.

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Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI von Bontzios, Yiorgos I., Dimopoulos, Michael G., Dimitriadis, Alexandros I., Hatzopoulos, Alkis A.

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De-embedding method for on-wafer RF CMOS inductor measurements von Drakaki, Maria, Hatzopoulos, Alkis A., Siskos, Stylianos

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A study of different types of current mirrors using polysilicon TFTs von Pappas, I, Nalpantidis, L, Kalenteridis, V, Siskos, S, Dimitriadis, C A, Hatzopoulos, A A

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A built-in current sensor using thin-film transistors von Hatzopoulos, A A, Siskos, S, Dimitriadis, C A, Papadopoulos, N, Pappas, I, Nalpantidis, L

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