High Electron Mobility Thin‐Film Transistors Based on Solution‐Processed Semiconducting Metal Oxide Heterojunctions and Quasi‐Superlattices von Lin, Yen‐Hung, Faber, Hendrik, Labram, John G., Stratakis, Emmanuel, Sygellou, Labrini, Kymakis, Emmanuel, Hastas, Nikolaos A., Li, Ruipeng, Zhao, Kui, Amassian, Aram, Treat, Neil D., McLachlan, Martyn, Anthopoulos, Thomas D.

Volltext

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements von Tsormpatzoglou, Andreas, Hastas, Nikolaos A., Mahmoudabadi, Forough, Choi, Nackbong, Hatalis, Miltiadis K., Dimitriadis, Charalabos A.

Volltext

Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements von Tsormpatzoglou, A., Hastas, N. A., Khan, S., Hatalis, M., Dimitriadis, C. A.

Volltext

Growth mechanisms and thickness effect on the properties of Al-doped ZnO thin films grown on polymeric substrates von Koidis, Christos, Logothetidis, Stergios, Kassavetis, Spiridon, Laskarakis, Argiris, Hastas, Nikolaos A., Valassiades, Odisseas

Volltext

Effects of buffer layer properties and annealing process on bulk heterojunction morphology and organic solar cell performance von Karagiannidis, Panagiotis G, Kalfagiannis, Nikolaos, Georgiou, Despoina, Laskarakis, Argiris, Hastas, Nikolaos A, Pitsalidis, Charalampos, Logothetidis, Stergios

Volltext

Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistor von Hastas, Nikolaos A, Dimitriadis, Charalabos A, Brini, Jean, Kamarinos, George

Volltext

On-state drain current modeling of large-grain poly-Si TFTs based on carrier transport through latitudinal and longitudinal grain boundaries von Hatzopoulos, A.T., Tassis, D.H., Hastas, N.A., Dimitriadis, C.A., Kamarinos, G.

Volltext

Hybrid organic–metal oxide multilayer channel transistors with high operational stability von Lin, Yen-Hung, Li, Wen, Faber, Hendrik, Seitkhan, Akmaral, Hastas, Nikolaos A., Khim, Dongyoon, Zhang, Qiang, Zhang, Xixiang, Pliatsikas, Nikolaos, Tsetseris, Leonidas, Patsalas, Panos A., Bradley, Donal D. C., Huang, Wei, Anthopoulos, Thomas D.

Volltext

An analytical hot-carrier induced degradation model in polysilicon TFTs von Hatzopoulos, A.T., Tassis, D.H., Hastas, N.A., Dimitriadis, C.A., Kamarinos, G.

Volltext

Short Channel Effects on LTPS TFT Degradation von Moschou, Despina C., Theodorou, Christoforos G., Hastas, Nikolaos A., Tsormpatzoglou, Andreas, Kouvatsos, Dimitrios N., Voutsas, Apostolos T., Dimitriadis, Charalabos A.

Volltext

Hybrid Organic-Metal Oxide Multilayer Channel Transistors with Record Operational Stability von Yen-Hung, Lin, Li, Wen, Faber, Hendrik, Hastas, Nikolaos A, Dongyoon Khim, Zhang, Qiang, Zhang, Xixiang, Pliatsikas, Nikolaos, Tsetseris, Leonidas, Patsalas, Panos A, Bradley, Donal D C, Huang, Wei, Anthopoulos, Thomas D

Volltext

Synthesis and thermoelectric properties of Cr-substituted higher manganese silicides prepared by pack cementation von Teknetzi, Aikaterini, Stathokostopoulos, Dimitrios, Ioannou, Ioanna, Tarani, Evangelia, Hastas, Nikolaos, Kyratsi, Theodora, Vourlias, George

Volltext

Trap properties of asymmetrical double-gate polysilicon thin-film transistors with low frequency noise in terms of the grain boundaries direction von Hastas, N., Tsormpatzoglou, A., Pappas, I., Kouvatsos, D. N., Moschou, D. C., Voutsas, A. T., Dimitriadis, C. A.

Volltext bestellen