The interfacial nature of proximity-induced magnetism and the Dzyaloshinskii-Moriya interaction at the Pt/Co interface von Rowan-Robinson, R. M., Stashkevich, A. A., Roussigné, Y., Belmeguenai, M., Chérif, S.-M., Thiaville, A., Hase, T. P. A., Hindmarch, A. T., Atkinson, D.

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Growth and characterisation of NiSb(0001)/GaAs(111)B epitaxial films von Aldous, James D., Burrows, Christopher W., Maskery, Ian, Brewer, Matthew, Pickup, David, Walker, Marc, Mudd, James, Hase, Thomas P.A., Duffy, Jon A., Wilkins, Stuart, Sánchez-Hanke, Cecilia, Bell, Gavin R.

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Characterization of thin film cadmium sulfide grown using a modified chemical bath deposition process von Archbold, M.D., Halliday, D.P., Durose, K., Hase, T.P.A., Smyth-Boyle, D., Govender, K.

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Depth-dependent magnetism in epitaxial MnSb thin films: effects of surface passivation and cleaning von Aldous, J D, Burrows, C W, Maskery, I, Brewer, M S, Hase, T P A, Duffy, J A, Lees, M R, Sánchez-Hanke, C, Decoster, T, Theis, W, Quesada, A, Schmid, A K, Bell, G R

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Development of low temperature approaches to device quality CdS: A modified geometry for solution growth of thin films and their characterisation von Archbold, M.D., Halliday, D.P., Durose, K., Hase, T.P.A., Boyle, D.S., Mazzamuto, S., Romeo, N., Bosio, A.

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Effect of annealing on the roughness and GMR of Fe/Cr multilayers von Laidler, H., Hickey, B.J., Hase, T.P.A., Tanner, B.K., Schad, R., Bruynseraede, Y.

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The relation of structure to giant magnetoresistance in Co/Cu multilayers von Hase, T.P.A., Pape, I., Tanner, B.K., Laidler, H., Ryan, P., Hickey, B.J.

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Non-uniform Gd distribution and magnetization profiles within GdCoFe alloy thin films von Inyang, O, Swindells, C, Rianto, D, Bouchenoire, L, Morris, R.J.H, Merkulov, A, Caruana, A, Kinane, C, Hase, T.P.A, Atkinson, D

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WITHDRAWN: Spin polarization of Cu and Mn atoms in [Co/Cu(x)/CuMn/Cu(x)]20 multilayers von Abes, M., Atkinson, D., Tanner, B.K., Charlton, T.R., Langridge, S., Hase, T.P.A., Ali, M., Marrows, C.H., Hickey, B.J., Neudert, A., Hicken, R.J., Arena, D., Wilkins, S.

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Interface intermixing and in-plane grain size in aluminum transition-metal bilayers von Buchanan, J. D. R., Hase, T. P. A., Tanner, B. K., Powell, C. J., Egelhoff, W. F.

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Structural properties of rf magnetron sputter deposited nickel manganate thin films von Schmidt, R., Basu, A., Brinkman, A.W., Hase, T.P.A., Klusek, Z., Pierzgalski, S., Datta, P.K.

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Influence of the interfacial roughness on electron channelling in Fe/Au(001) multilayers von Cole, A, Hickey, B J, Hase, T P A, Buchanan, J D R, Tanner, B K

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Analysis of grazing incidence X-ray diffuse scatter from Co–Cu multilayers von Pape, I, Hase, T.P.A, Tanner, B.K, Wormington, M

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Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature von Wu, X.S, Hase, T.P.A, Tanner, B.K, Cheng, H.H

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The out-of-plane correlation length of the conformal roughness in Co–Pd multilayers von Pym, A.T.G., Rozatian, A.S.H., Marrows, C.H., Hickey, B.J., Hase, T.P.A., Tanner, B.K.

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Anisotropy and interface structure in sputtered Co/Pt multilayers on Si von Rozatian, A.S.H., Fulthorpe, B.D., Hase, T.P.A., Read, D.E., Ashcroft, G., Joyce, D.E., Grundy, P.J., Amighian, J., Tanner, B.K.

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High resolution X-ray scattering from nanotechnology materials von Tanner, B.K., Hase, T.P.A., Clarke, J., Pape, I., Li-Bassi, A., Fulthorpe, B.D.

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Structural and magnetic changes on annealing permalloy/copper multilayers von Fulthorpe, B.D, Hase, T.P.A, Tanner, B.K, Marrows, C.H, Hickey, B.J

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X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers von Luo, G.M, Mai, Z.H, Hase, T.P.A, Fulthorpe, B.D, Tanner, B.K, Marrows, C.H, Hickey, B.J

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Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(0 0 1) films von Vaz, C.A.F, Lauhoff, G, Bland, J.A.C, Fulthorpe, B.D, Hase, T.P.A, Tanner, B.K, Langridge, S, Penfold, J

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