Automated design error debug using high-level decision diagrams and mutation operators von Raik, Jaan, Repinski, Urmas, Chepurov, Anton, Hantson, Hanno, Ubar, Raimund, Jenihhin, Maksim

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On the Reuse of TLM Mutation Analysis at RTL von Guarnieri, Valerio, Di Guglielmo, Giuseppe, Bombieri, Nicola, Pravadelli, Graziano, Fummi, Franco, Hantson, Hanno, Raik, Jaan, Jenihhin, Maksim, Ubar, Raimund

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Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis von Hantson, Hanno, Repinski, Urmas, Raik, Jaan, Jenihhin, Maksim, Ubar, Raimund

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Combining dynamic slicing and mutation operators for ESL correction von Repinski, U., Hantson, H., Jenihhin, M., Raik, J., Ubar, R., Di Guglielmo, G., Pravadelli, G., Fummi, F.

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Mutation analysis for SystemC designs at TLM von Guarnieri, V., Bombieri, N., Pravadelli, G., Fummi, F., Hantson, H., Raik, J., Jenihhin, M., Ubar, R.

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Mutation analysis with high-level decision diagrams von Hantson, Hanno, Raik, Jaan, Jenihhin, Maksim, Chepurov, Anton, Ubar, Raimund, di Guglielmo, Giuseppe, Fummi, Franco

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Automated Design Error Localization in RTL Designs von Jenihhin, Maksim, Tsepurov, Anton, Tihhomirov, Valentin, Raik, Jaan, Hantson, Hanno, Ubar, Raimund, Bartsch, Gunter, Escobar, JorgeHernan Meza, Wuttke, Heinz-Dietrich

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