X-Ray Diffraction and Raman Spectroscopy Analyses of GaSb-Enriched Si Surface Formed by Applying Diffusion Doping Technique von Iliyev, Xalmurat M., Odzhaev, Vladimir B., Isamov, Sobir B., Isakov, Bobir O., Ismaylov, Bayrambay K., Ayupov, Kutub S., Hamrokulov, Shahzodbek I., Khasanbaeva, Sarvinoz O.

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