On the high frequency excess noise and equivalent circuit representation of the MOS-FET with n-type channel von Halladay, H.E., van der Ziel, A.

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Field-dependent mobility effects in the excess noise of junction-gate field-effect transistors von Halladay, H.E., van der Ziel, A.

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Dc characteristics of junction gate field-effect transistors von Halladay, H.E., van der Ziel, A.

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Excess noise in field-effect transistors von Halladay, H.E., Bruncke, W.C.

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Methylmercury Alters Eph and Ephrin Expression During Neuronal Differentiation of P19 Embryonal Carcinoma Cells von Wilson, D.T., Polunas, M.A., Zhou, R., Halladay, A.K., Lowndes, H.E., Reuhl, K.R.

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