Text line and word segmentation of handwritten documents von Louloudis, G., Gatos, B., Pratikakis, I., Halatsis, C.

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Text line detection in handwritten documents von Louloudis, G., Gatos, B., Pratikakis, I., Halatsis, C.

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A knowledge-based approach for developing multi-channel e-government services von Vassilakis, C., Lepouras, G., Halatsis, C.

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A low-cost concurrent BIST scheme for increased dependability von Voyiatzis, I., Halatsis, C.

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A concurrent built-in self-test architecture based on a self-testing RAM von Voyiatzis, I., Paschalis, A., Gizopoulos, D., Kranitis, N., Halatsis, C.

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An Input Vector Monitoring Concurrent BIST Architecture Based on a Precomputed Test Set von Voyiatzis, Ioannis, Paschalis, Antonis, Gizopoulos, Dimitris, Halatsis, Constantin, Makri, Frosso S., Hatzimihail, Miltiadis

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OASys: An AND/OR parallel logic programming system von Vlahavas, I, Kefalas, P, Halatsis, C

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An Accumulator-Based BIST Approach for Two-Pattern Testing von Voyiatzis, I, Paschalis, A, Nikolos, D, Halatsis, C

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eg-GRIDS: Context-Free Grammatical Inference from Positive Examples Using Genetic Search von Petasis, Georgios, Paliouras, Georgios, Spyropoulos, Constantine D., Halatsis, Constantine

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Measures of intrinsic hardness for constraint satisfaction problem instances von BOUKEAS, George, HALATSIS, Constantinos, ZISSIMOPOULOS, Vassilis, STAMATOPOULOS, Panagiotis

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R-CBIST: an effective RAM-based input vector monitoring concurrent BIST technique von Voyiatzis, I., Paschalis, A., Nikolos, D., Halatsis, C.

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Performance of circuit-switched interconnection networks under nonuniform traffic patterns von Pombortsis, A, Halatsis, C

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Testable designs of one-count generators von HANIOTAKIS, TH, PASCHALIS, A., HALATSIS, C., PHILOKYPROU, G.

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A Comparative Study of Four Ontology Visualization Techniques in Protege: Experiment Setup and Preliminary Results von Katifori, A., Torou, E., Halatsis, C., Lepouras, G., Vassilakis, C.

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Supporting Research in Historical Archives: Historical Information Visualization and Modeling Requirements von Katifori, A., Torou, E., Vassilakis, C., Halatsis, C.

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Robust test generation for transistor stuck-open faults in CMOS complex gates von TSIATOUHAS, Y., PASCHALIS, A., NIKOLOS, D., HALATSIS, C.

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Efficient modular design of TSC checkers for m-out-of-2m codes von Paschalis, A.M., Nikolos, D., Halatsis, C.

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A Context-Based Adaptive Visualization Environment von Golemati, M., Halatsis, C., Vassilakis, C., Katifori, A., Lepouras, G.

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Optimal Periodic Testing of Intermittent Faults In Embedded Pipelined Processor Applications von Kranitis, N., Merentitis, A., Laoutaris, N., Theodorou, G., Paschalis, A., Gizopoulos, D., Halatsis, C.

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Hierarchical robust test generation for CMOS circuit stuck-open faults von TSIATOUHAS, Y., HANIOTAKIS, TH, NIKOLOS, D., PASCHALIS, A., HALATSIS, C.

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