Air-Filled Ultrasound Contrast Agents Do Not Damage the Cerebral Microvasculature or Brain Tissue in Rats von HAGGAG, KATHRINE J, RUSSELL, DAVID, WALDAY, PER, SKIPHAMN, AUD, TORVIK, ANSGAR

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Contrast enhanced pulsed Doppler and colour-coded duplex studies of the cranial vasculature von Haggag, K J, Russell, D, Brucher, R, Dahl, A, Jakobsen, J, Bakke, S, Muan, B

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Cerebral microembolism detected by transcranial Doppler ultrasonography von Lund, C, Braekken, S K, Haggag, K J, Røste, L S, Russell, D

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Clinical and Morphologic Characteristics of Fibroblast Growth Factor Receptor Inhibitor–Associated Retinopathy von Francis, Jasmine H, Harding, James J, Schram, Alison M, Canestraro, Julia, Haggag-Lindgren, Dianna, Heinemann, Murk, Kriplani, Anuja, Jhaveri, Komal, Voss, Martin H, Bajorin, Dean, Abou-Alfa, Ghassan K, Iyer, Gopa, Drilon, Alexander, Rosenberg, Jonathan, Abramson, David H

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Mouse Nkrp1-Clr gene cluster sequence and expression analyses reveal conservation of tissue-specific MHC-independent immunosurveillance von Zhang, Qiang, Rahim, Mir Munir A, Allan, David S J, Tu, Megan M, Belanger, Simon, Abou-Samra, Elias, Ma, Jaehun, Sekhon, Harman S, Fairhead, Todd, Zein, Haggag S, Carlyle, James R, Anderson, Stephen K, Makrigiannis, Andrew P

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RM-011Safety and efficacy of biweekly cetuximab based chemotherapy for patients with metastatic colorectal cancer von Zekri, J, Farag, K, Haggag, R

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RM-011 Safety and efficacy of biweekly cetuximab based chemotherapy for patients with metastatic colorectal cancer von Zekri, J., Farag, K., Haggag, R.

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Increased interleukin 18 activity in adolescents with early-onset psychosis is associated with cortisol and depressive symptoms von Wedervang-Resell, Kirsten, Friis, Svein, Lonning, Vera, Smelror, Runar E., Johannessen, Cecilie, Reponen, Elina J., Lyngstad, Siv H., Lekva, Tove, Aukrust, Pål, Ueland, Thor, Andreassen, Ole A., Agartz, Ingrid, Myhre, Anne M.

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Indentation-energy-to-fracture ( IEF) parameter for characterization of DBTT in carbon steels using nondestructive automated ball indentation (ABI) technique von Haggag, Fahmy M., Byun, Thak-Sang, Hong, J.H., Miraglia, P.Q., Murty, K.Linga

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Translating preventive chemotherapy prevalence thresholds for Schistosoma mansoni from the Kato-Katz technique into the point-of-care circulating cathodic antigen diagnostic test von Barenbold, O, Garba, A, Colley, DG, Fleming, FM, Haggag, AA, Ramzy, RMR, Assare, RK, Tukahebwa, EM, Mbonigaba, JB, Bucumi, V, Kebede, B, Yibi, MS, Meite, A, Coulibaly, JT, N'Goran, EK, Tchuente, L-AT, Mwinzi, P, Utzinger, J, Vounatsou, P

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Measurement of through-the-thickness variations of mechanical properties in SA508 Gr.3 pressure vessel steels using ball indentation test technique von Byun, T.S., Hong, J.H., Haggag, F.M., Farrell, K., Lee, E.H.

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Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement von Taylor, K.A., Nelson, B., Chong, A., Lin, H., Chan, E., Soma, M., Haggag, H., Huard, J., Braatz, J.

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On the positive channel threshold voltage of metal gate electrodes on high-permittivity gate dielectrics von Schaeffer, J. K., Gilmer, D. C., Samavedam, S., Raymond, M., Haggag, A., Kalpat, S., Steimle, B., Capasso, C., White, B. E.

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High-performance chip reliability from short-time-tests-statistical models for optical interconnect and HCI/TDDB/NBTI deep-submicron transistor failures von Haggag, A., McMahon, W., Hess, K., Cheng, K., Lee, J., Lyding, J.

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Precision electrical trimming of very low TCR poly-SiGe resistors von Babcock, J.A., Francis, P., Bashir, R., Kabir, A.E., Schroder, D.K., Lee, M.S.L., Dhayagude, T., Yindeepol, W., Prasad, S.J., Kalnitsky, A., Thomas, M.E., Haggag, H., Egan, K., Bergemont, A., Jansen, P.

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On the positive channel threshold voltage of metal gate electrodeson high-permittivity gate dielectrics von Schaeffer, J. K., Gilmer, D. C., Samavedam, S., Raymond, M., Haggag, A., Kalpat, S., Steimle, B., Capasso, C., White, B. E.

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The physics of determining chip reliability von Hess, K., Haggag, A., McMahon, W., Cheng, K., Lee, J., Lyding, J.

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Experimental results for high-speed jitter measurement technique von Taylor, K., Nelson, B., Chong, A., Nguyen, H., Lin, H., Soma, M., Haggag, H., Huard, J., Braatz, J.

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Impacts of process induced interfacial defects on gate oxide integrity von Liu, N., Haggag, A., Peschke, J., Moosa, M., Weintraub, C., Lazar, H., Campbell, G., Srivastava, A., Liu, J., Porter, J., Picone, K., Parrish, J., Jiang, J.

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Realistic Projections of Product Fails from NBTI and TDDB von Haggag, A., Moosa, M., Liu, N., Burnett, D., Abeln, G., Kuffler, M., Forbes, K., Schani, P., Shroff, M., Hall, M., Paquette, C., Anderson, G., Pan, D., Cox, K., Higman, J., Mendicino, M., Venkatesan, S.

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