A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs von Hou, Chih-Sheng, Li, Jin-Fu, Fu, Ting-Jun

Volltext

Memory Built-in Self-Repair Planning Framework for RAMs in SoCs von Hou, Chih-Sheng, Li, Jin-Fu, Tseng, Tsu-Wei

Volltext

Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults von Li, Jin-Fu, Tseng, Tsu-Wei, Hou, Chih-Sheng

Volltext

Integrated microelectronic device for label-free nucleic acid amplification and detection von Hou, Chih-Sheng Johnson, Godin, Michel, Payer, Kristofor, Chakrabarti, Raj, Manalis, Scott R

Volltext

High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy von Hou, Chih-Sheng, Li, Jin-Fu

Volltext

Label-Free Microelectronic PCR Quantification von Hou, Chih-Sheng Johnson, Milovic, Nebojsa, Godin, Michel, Russo, Peter R, Chakrabarti, Raj, Manalis, Scott R

Volltext

Allocation of RAM built-in self-repair circuits for SOC dies of 3D ICs von Chih-Sheng Hou, Jin-Fu Li

Volltext

Monitoring of Heparin and Its Low-molecular-Weight Analogs by Silicon Field Effect von Milović, Nebojša M., Behr, Jonathan R., Godin, Michel, Hou, Chih-Sheng Johnson, Payer, Kristofor R., Chandrasekaran, Aarthi, Russo, Peter R., Sasisekharan, Ram, Manalis, Scott R.

Volltext

A hybrid ECC and redundancy technique for reducing refresh power of DRAMs von Yun-Chao Yu, Chih-Sheng Hou, Li-Jung Chang, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu

Volltext

EZPAL: Environment for composing constraint axioms by instantiating templates von Hou, Chih-Sheng J., Musen, Mark A., Noy, Natalya F.

Volltext

Testing Disturbance Faults in Various NAND Flash Memories von Hou, Chih-Sheng, Li, Jin-Fu

Volltext

Automatic generation of memory built-in self-repair circuits in SOCs for minimizing test time and area cost von Tsu-Wei Tseng, Chih-Sheng Hou, Jin-Fu Li

Volltext

Disturbance fault testing on various NAND flash memories von Chih-Sheng Hou, Jin-Fu Li

Volltext

A Built-in Method to Repair SoC RAMs in Parallel von Tseng, Tsu-Wei, Li, Jin-Fu, Hou, Chih-Sheng

Volltext

An FPGA-based test platform for analyzing data retention time distribution of DRAMs von Chih-Sheng Hou, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou, Cheng-Wen Wu

Volltext bestellen

Built-in self-diagnosis and test time reduction techniques for NAND flash memories von Che-Wei Chou, Chih-Sheng Hou, Jin-Fu Li

Volltext bestellen

Test and Repair Scheduling for Built-In Self-Repair RAMs in SOCs von Chih-Sheng Hou, Jin-Fu Li, Che-Wei Chou

Volltext bestellen

CANTILEVER FORCE SENSOR von HOU, Chih-Sheng, Chou, Chia-Hung

Volltext bestellen

SENSOR WITH PLURALITY OF SENSOR ELEMENTS ARRANGED ON A FLEXIBLE SUBSTRATE von Chou, Chia-Hung, Chen, Sih-Wei, Hou, Chih-Sheng

Volltext bestellen

Cantilever force sensor von Chou, Chia-Hung, Hou, Chih-Sheng

Volltext bestellen