Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy von Abe, Eiji, Ishikawa, Ryo, Okunishi, Eiji, Sawada, Hidetaka, Kondo, Yukihito, Hosokawa, Fumio

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Aberration-corrected STEM/TEM imaging at 15 kV von Sasaki, Takeo, Sawada, Hidetaka, Hosokawa, Fumio, Sato, Yuta, Suenaga, Kazu

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Benchmark test of accelerated multi-slice simulation by GPGPU von Hosokawa, Fumio, Shinkawa, Takao, Arai, Yoshihiro, Sannomiya, Takumi

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Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM von Sawada, Hidetaka, Shimura, Naoki, Hosokawa, Fumio, Shibata, Naoya, Ikuhara, Yuichi

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Development of Cs and Cc correctors for transmission electron microscopy von Hosokawa, Fumio, Sawada, Hidetaka, Kondo, Yukihito, Takayanagi, Kunio, Suenaga, Kazutomo

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Evaluation of residual aberration in fifth-order geometrical aberration correctors von Morishita, Shigeyuki, Kohno, Yuji, Hosokawa, Fumio, Suenaga, Kazu, Sawada, Hidetaka

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Phase-contrast scanning transmission electron microscopy von Minoda, Hiroki, Tamai, Takayuki, Iijima, Hirofumi, Hosokawa, Fumio, Kondo, Yukihito

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Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy von Oshima, Yoshifumi, Sawada, Hidetaka, Hosokawa, Fumio, Okunishi, Eiji, Kaneyama, Toshikatsu, Kondo, Yukihito, Niitaka, Seiji, Takagi, Hidenori, Tanishiro, Yasumasa, Takayanagi, Kunio

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Multi-pore carbon phase plate for phase-contrast transmission electron microscopy von Sannomiya, Takumi, Junesch, Juliane, Hosokawa, Fumio, Nagayama, Kuniaki, Arai, Yoshihiro, Kayama, Yoko

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Counting lithium ions in the diffusion channel of an LiV2O4 crystal von Lee, Soyeon, Oshima, Yoshifumi, Sawada, Hidetaka, Hosokawa, Fumio, Okunishi, Eiji, Kaneyama, Toshikatsu, Kondo, Yukihito, Niitaka, Seiji, Takagi, Hidenori, Tanishiro, Yasumasa, Takayanagi, Kunio

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Evaluation of automated particle picking for cryogenic electron microscopy using high‐precision transmission electron microscope simulation based on a multi‐slice method von Ohashi, Masataka, Hosokawa, Fumio, Shinkawa, Takao, Iwasaki, Kenji

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Evaluation of probe size in STEM imaging at 30 and 60kV von Sasaki, Takeo, Sawada, Hidetaka, Okunishi, Eiji, Hosokawa, Fumio, Kaneyama, Toshikatsu, Kondo, Yukihito, Kimoto, Koji, Suenaga, Kazu

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Aberration-corrected STEM/TEM imaging at 15kV von Sasaki, Takeo, Sawada, Hidetaka, Hosokawa, Fumio, Sato, Yuta, Suenaga, Kazu

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Oxygen-rich Ti1−O2 pillar growth at a gold nanoparticle–TiO2 contact by O2 exposure von Tanaka, Takayuki, Sano, Kentaro, Ando, Masafumi, Sumiya, Ami, Sawada, Hidetaka, Hosokawa, Fumio, Okunishi, Eiji, Kondo, Yukihito, Takayanagi, Kunio

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Improving Data Quality in Traditional Low‐Dose Scanning Transmission Electron Microscopy Imaging von Wang, Lingling, Jiang, Yilan, Zhou, Yi, Shi, Ruikai, Hosokawa, Fumio, Terasaki, Osamu, Zhang, Qing

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Evaluation of Automated Particle Picking for Cryo-EM Using High Precision TEM Simulation by Utilizing a Multi-slice Method von Ohashi, Masataka, Hosokawa, Fumio, Shinkawa, Takao, Iwasaki, Kenji

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Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscope von Hosokawa, Fumio, Danev, Radostin, Arai, Yoshihiro, Nagayama, Kuniaki

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Imaging with Electron Beam: Transmission Electron Microscopy von SANNOMIYA, Takumi, HOSOKAWA, Fumio

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Accurate Evaluation of Aberration for Probe-Forming System and Influence of Aberration on High-Resolution STEM image von Sawada, Hidetaka, Hosokawa, Fumio, Kirkland, Angus I.

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Image transfer with spatial coherence for aberration corrected transmission electron microscopes von Hosokawa, Fumio, Sawada, Hidetaka, Shinkawa, Takao, Sannomiya, Takumi

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