A1231 - photoscanning and 3D remodeling for next generation pathology reporting in radical prostatectomy von Hohage, J., Urban, P., Ritzmann, S., Gödde, D., Von Rundstedt, F-C.

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photoscanning and 3D remodeling for next generation pathology reporting in radical prostatectomy von Hohage, J., Urban, P., Ritzmann, S., Gödde, D., Von Rundstedt, F-C.

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Effect of stored elastic energy on phase content of ion assisted deposited boron nitride films von Hohage, J., Pompe, W.

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Cancer Reporting Protocols in TURBT – standardized reporting of bladder cancer and improvement of communication between pathologists and urologists von Gallardo Zamora, L., Hohage, J., Degener, S., Dotse, J., Gödde, D., Kvasnicka, H., Von Rundstedt, F-C.

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A1056 - Cancer Reporting Protocols in TURBT – standardized reporting of bladder cancer and improvement of communication between pathologists and urologists von Gallardo Zamora, L., Hohage, J., Degener, S., Dotse, J., Gödde, D., Kvasnicka, H., Von Rundstedt, F-C.

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A copper-dielectric cap interface with high resistance to electromigration for high performance semiconductor devices von Hohage, J., Lehr, M.U., Kahlert, V.

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Copper–dielectric cap interface with enhanced reliability for 45 nm technology and beyond von Hohage, J., Mayer, U., Lehr, M.U., Feustel, F., Aubel, O., Hennesthal, C.

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Sub-50 nm gate length SOI transistor development for high performance microprocessors von Horstmann, M., Greenlaw, D., Feudel, Th, Wei, A., Frohberg, K., Burbach, G., Gerhardt, M., Lenski, M., Stephan, R., Wieczorek, K., Schaller, M., Hohage, J., Ruelke, H., Klais, J., Huebler, P., Luning, S., Bentum, R. van, Grasshoff, G., Schwan, C., Cheek, J., Buller, J., Krishnan, S., Raab, M., Kepler, N.

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Process options for improving electromigration performance in 32nm technology and beyond von Aubel, O., Hohage, J., Feustel, F., Hennesthal, C., Mayer, U., Preusse, A., Nopper, M., Lehr, M.U., Boemmels, J., Wehner, S.

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Sub-50nm gate length SOI transistor development for high performance microprocessors von Horstmann, M., Greenlaw, D., Feudel, Th, Wei, A., Frohberg, K., Burbach, G., Gerhardt, M., Lenski, M., Stephan, R., Wieczorek, K., Schaller, M., Hohage, J., Ruelke, H., Klais, J., Huebler, P., Luning, S., Bentum, R. van, Grasshoff, G., Schwan, C., Cheek, J., Buller, J., Krishnan, S., Raab, M., Kepler, N.

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Advanced transistor structures for high performance microprocessors von Horstmann, M., Greenlaw, D., Feudel, T., Wei, A., Frohberg, K., Burbach, G., Gerhardt, M., Lenski, M., Stephan, R., Wieczorek, K., Schaller, M., Hohage, J., Ruelke, H., Klais, J., Huebler, P., Luning, S., van Bentum, R., Grasshoff, G., Schwan, C., Cheek, J., Buller, J., Krishnan, S., Raab, M., Kepler, N.

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Manufacturing implementation of low-k dielectrics for copper damascene technology von Ruelke, H., Streck, C., Hohage, J., Weiher-Telford, S., Chretrien, O.

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Integration and optimization of embedded-sige, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies von Su, L.T., Pellerin, J., Huang, S.F., Khare, M., Schepis, D., Rim, K., Liming, S., Waite, A., Sato, T., Panda, S., Nii, H., Lee, W., Holt, J., Fried, D., Chidambarrao, D., Chen, H., Kepler, N., Raab, M., Greenlaw, D., Stephan, R., Hubler, P., Ruelke, H., Herzog, O., Engelmann, H.-J., Schaller, M., Salz, H., Trui, B., Trentsch, M., Reichel, C., Press, P., Otterbach, R., Neu, A., Lenski, M., Koerner, G., Klais, J., Javorka, P., Hohage, J., Hempel, K., Hellmich, A., Gerhardt, M., Frohberg, K., Feudel, T., Bierstedt, H., Hontschel, J., Kammler, T., Wei, A., Horstmann, M.

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High Performance SOI Technology for Sub-45nm Gate Length CMOS Manufacturing von Horstmann, Manfred, Greenlaw, David, Huebler, P., Stephan, R., Feudel, Th, Wei, A., Frohberg, K., Lenski, M., Wieczorek, K., Burbach, G., Schwan, C., Press, P., Kammler, Th, Bierstedt, H., Otterbach, R., Neu, A., Schaller, M., Salz, H., Hohage, J., Ruelke, H., Klais, J., Grasshoff, G., Ehrichs, E., Goad, S., Raab, M., Kepler, N.

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High performance SOI technology for sub-45nm gate length CMOS manufacturing von HORSTMANN, M, GREENLAW, D, SCHWAN, C, PETERS, C, LENSKI, M, PRESS, P, KAMMLER, Th, BIERSTEDT, H, OTTERBACH, R, NEU, A, WIECZOREK, K, SCHALLER, M, HUEBLER, P, SALZ, H, HOHAGE, J, RUELKE, H, KLAIS, J, GRASSHOFF, G, EHRICHS, E, GOAD, S, RAAB, M, KEPLER, N, STEPHAN, R, FEUDEL, Th, WEI, A, FROHBERG, K, HOENTSCHEL, J, JAVORKA, P, BURBACH, G

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Learned infinite elements for helioseismology: Learning transparent boundary conditions for the solar atmosphere von Fournier, D., Hohage, T., Preuss, J., Gizon, L.

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High performance 65 nm SOI technology with enhanced transistor strain and advanced-low-K BEOL von Lee, W.-H., Waite, A., Nii, H., Nayfeh, H.M., McGahay, V., Nakayama, H., Fried, D., Chen, H., Black, L., Bolam, R., Cheng, J., Chidambarrao, D., Christiansen, C., Cullinan-Scholl, M., Davies, D.R., Domenicucci, A., Fisher, P., Fitzsimmons, J., Gill, J., Gribelyuk, M., Harmon, D., Holt, J., Ida, K., Kiene, M., Kluth, J., Labelle, C., Madan, A., Malone, K., McLaughlin, P.V., Minami, M., Mocuta, D., Murphy, R., Muzzy, C., Newport, M., Panda, S., Peidous, I., Sakamoto, A., Sato, T., Sudo, G., VanMeer, H., Yamashita, T., Zhu, H., Agnello, P., Bronner, G., Freeman, G., Huang, S.-F., Ivers, T., Luning, S., Miyamoto, K., Nye, H., Pellerin, J., Rim, K., Schepis, D., Spooner, T., Chen, X., Khare, M., Horstmann, M., Wei, A., Kammler, T., Hontschel, J., Bierstedt, H., Engelmann, H.-J., Hellmich, A., Hempel, K., Koerner, G., Neu, A., Otterbach, R., Reichel, C., Trentsch, M., Press, P., Frohberg, K., Schaller, M., Salz, H., Hohage, J., Ruelke, H., Klais, J., Raab, M., Greenlaw, D., Kepler, N.

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Reconstruction of wave front and object for inline holography from a set of detection planes von Hagemann, J, Robisch, A-L, Luke, D R, Homann, C, Hohage, T, Cloetens, P, Suhonen, H, Salditt, T

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Elastic energy regularization for inverse obstacle scattering problems von Eckhardt, J, Hiptmair, R, Hohage, T, Schumacher, H, Wardetzky, M

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Multichannel Three-Dimensional SOLA Inversion for Local Helioseismology von Jackiewicz, J., Birch, A. C., Gizon, L., Hanasoge, S. M., Hohage, T., Ruffio, J.-B., Švanda, M.

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