1/f$ Temperature Fluctuation Mechanism and Some Applications to Electronic Devices von Higuchi, Hisayuki, Homma, Noriyuki, Nakamura, Tohru

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A 1/f Velocity Fluctuation Spectrum in One-Dimensional Random Walks von Higuchi, Hisayuki

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Retardation of Sb Diffusion in Si during Thermal Oxidation von Mizuo, Shoichi, Higuchi, Hisayuki

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Effects of Oxidation on Aluminum Diffusion in Silicon von Mizuo, Shoichi, Higuchi, Hisayuki

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The Range of Diffusion Enhancement of B and P in Si during Thermal Oxidation von Mizuo, Shoichi, Higuchi, Hisayuki

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Preservation of Point Defect Distribution in FZ Silicon von Mizuo, Shoichi, Higuchi, Hisayuki

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A high‐speed, low‐power SOI CMOS circuit with variable threshold voltages von Higuchi, Hisayuki, Ikeda, Takahide

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Effects of Backside Oxidation on the Size of Oxidation Induced Stacking Faults at the Front Surface of FZ Si Wafers von Mizuo, Shoichi, Higuchi, Hisayuki

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Observations of Channels of MOS Field Effect Transistors Using a Scanning-Electron Microscope von Higuchi, Hisayuki, Maki, Michiyoshi

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U-Groove Isolation Technology for High Density Bipolar LSI's von Tamaki, Yoichi, Kure, Tokuo, Shiba, Takeo, Higuchi, Hisayuki

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A high-speed, low-power SOI CMOS circuit with variable threshold voltages von Higuchi, Hisayuki, Ikeda, Takahide

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Quantitative Study of Implanted Gold Atoms in Silicon p + -n Junctions by Measurement of the Thermally-Stimulated Current von Nitta, Takahisa, Higuchi, Hisayuki

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Measurement of the Lifetime of Minority Carriers in Semiconductors with a Scanning Electron Microscope von Higuchi, Hisayuki, Tamura, Hifumi

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A 2 ns access, 285 MHz, two-port cache macro using double global bit-line pairs von Osada, K., Higuchi, H., Ishibashi, K., Hashimoto, N., Shiozawa, K.

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Diffusion of Antimony in Si Directly Masked with Si3N4 Films von MIZUO, Shoichi, HIGUCHI, Hisayuki

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Oxidation Effects on Gallium Diffusion in Silicon von MIZUO, Shoichi, HIGUCHI, Hisayuki

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Effect of Back‐Side Oxidation on B and P Diffusion in Si Directly Masked with Si3 N 4 Films von Mizuo, Shoichi, Higuchi, Hisayuki

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A 2.6-ns wave-pipelined CMOS SRAM with dual-sensing-latch circuits von Tachibana, S., Higuchi, H., Takasugi, K., Sasaki, K., Yamanaka, T., Nakagome, Y.

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Analog circuit design methodology in a low power RISC microprocessor von Ishibashi, Koichiro, Higuchi, Hisayuki, Shimbo, Toshinobu, Uchiyama, Kunio, Shiozawa, Kenji, Hashimoto, Naotaka, Ikeda, Shuji

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Anomalous Diffusion of B and P in Si Directly Masked with Si 3 N 4 von Mizuo, Shoichi, Higuchi, Hisayuki

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