Threshold and Characteristic LETs in SRAM SEU Cross-Section Curves von Kobayashi, Daisuke, Uematsu, Masashi, Hirose, Kazuyuki

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An SRAM SEU Cross Section Curve Physics Model von Kobayashi, Daisuke, Hirose, Kazuyuki, Sakamoto, Keita, Tsuchiya, Yuta, Okamoto, Shogo, Baba, Shunsuke, Shindou, Hiroyuki, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi

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Tolerance of Perovskite Solar Cell to High-Energy Particle Irradiations in Space Environment von Miyazawa, Yu, Ikegami, Masashi, Chen, Hsin-Wei, Ohshima, Takeshi, Imaizumi, Mitsuru, Hirose, Kazuyuki, Miyasaka, Tsutomu

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Proton Irradiation Tolerance of High-Efficiency Perovskite Absorbers for Space Applications von Kanaya, Shusaku, Kim, Gyu Min, Ikegami, Masashi, Miyasaka, Tsutomu, Suzuki, Kohtaku, Miyazawa, Yu, Toyota, Hiroyuki, Osonoe, Kanta, Yamamoto, Tomoyuki, Hirose, Kazuyuki

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Data-Retention-Voltage-Based Analysis of Systematic Variations in SRAM SEU Hardness: A Possible Solution to Synergistic Effects of TID von Kobayashi, Daisuke, Mori, Yoshiharu, Matsuura, Daisuke, Kusano, Masaki, Narita, Takanori, Ishii, Shigeru, Hirose, Kazuyuki, Sakamoto, Keita, Okamoto, Shogo, Baba, Shunsuke, Shindou, Hiroyuki, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi

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Investigation of Buried-Well Potential Perturbation Effects on SEU in SOI DICE-Based Flip-Flop Under Proton Irradiation von Sakamoto, Keita, Baba, Shunsuke, Kobayashi, Daisuke, Okamoto, Shogo, Shindou, Hiroyuki, Kawasaki, Osamu, Makino, Takahiro, Mori, Yoshiharu, Matuura, Daisuke, Kusano, Masaki, Narita, Takanori, Ishii, Shigeru, Hirose, Kazuyuki

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Evaluation of Damage Coefficient for Minority-Carrier Diffusion Length of Triple-Cation Perovskite Solar Cells under 1 MeV Electron Irradiation for Space Applications von Miyazawa, Yu, Kim, Gyu Min, Ishii, Ayumi, Ikegami, Masashi, Miyasaka, Tsutomu, Suzuki, Yudai, Yamamoto, Tomoyuki, Ohshima, Takeshi, Kanaya, Shusaku, Toyota, Hiroyuki, Hirose, Kazuyuki

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Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method von Motoki, Keisuke, Miyazawa, Yu, Kobayashi, Daisuke, Ikegami, Masashi, Miyasaka, Tsutomu, Yamamoto, Tomoyuki, Hirose, Kazuyuki

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Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage von Kobayashi, Daisuke, Hayashi, Naoki, Hirose, Kazuyuki, Kakehashi, Yuya, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi, Matsuura, Daisuke, Mori, Yoshiharu, Kusano, Masaki, Narita, Takanori, Ishii, Shigeru, Masukawa, Kazunori

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The Impact of Multiple-Cell Charge Generation on Multiple-Cell Upset in a 20-nm Bulk SRAM von Kato, Takashi, Yamazaki, Takashi, Maruyama, Kazunori, Soeda, Takeshi, Itsuji, Hiroaki, Kobayashi, Daisuke, Hirose, Kazuyuki, Matsuyama, Hideya

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Characterization of stability of benchmark organic photovoltaic films after proton and electron bombardments von Barbé, Jérémy, Lee, Harrison K. H., Toyota, Hiroyuki, Hirose, Kazuyuki, Sato, Shin-ichiro, Ohshima, Takeshi, Heasman, Keith C., Tsoi, Wing C.

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A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements von Makino, Takahiro, Onoda, Shinobu, Ohshima, Takeshi, Kobayashi, Daisuke, Ikeda, Hirokazu, Hirose, Kazuyuki

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Theoretical investigation of the breakdown electric field of SiC polymorphs von Yamaguchi, Kikou, Kobayashi, Daisuke, Yamamoto, Tomoyuki, Hirose, Kazuyuki

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Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets von Kobayashi, Daisuke, Hirose, Kazuyuki, Ito, Taichi, Kakehashi, Yuya, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi, Matsuura, Daisuke, Narita, Takanori, Kato, Masahiro, Ishii, Shigeru, Masukawa, Kazunori

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Influence of Heavy Ion Irradiation on Perpendicular-Anisotropy CoFeB-MgO Magnetic Tunnel Junctions von Kobayashi, Daisuke, Kakehashi, Yuya, Hirose, Kazuyuki, Onoda, Shinobu, Makino, Takahiro, Ohshima, Takeshi, Ikeda, Shoji, Yamanouchi, Michihiko, Sato, Hideo, Enobio, Eli Christopher, Endoh, Tetsuo, Ohno, Hideo

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The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs von Lourenco, Nelson E., Fleetwood, Zachary E., Ildefonso, Adrian, Wachter, Mason T., Roche, Nicolas J-H, Khachatrian, Ani, McMorrow, Dale, Buchner, Stephen P., Warner, Jeffrey H., Itsuji, Hiroaki, Kobayashi, Daisuke, Hirose, Kazuyuki, Paki, Pauline, Raman, Ashok, Cressler, John D.

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Laser Visualization of the Development of Long Line-Type Mutli-Cell Upsets in Back-Biased SOI SRAMs von Itsuji, Hiroaki, Kobayashi, Daisuke, Kawasaki, Osamu, Matsuura, Daisuke, Narita, Takanori, Kato, Masahiro, Ishii, Shigeru, Masukawa, Kazunori, Hirose, Kazuyuki

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Soft errors in 10-nm-scale magnetic tunnel junctions exposed to high-energy heavy-ion radiation von Kobayashi, Daisuke, Hirose, Kazuyuki, Makino, Takahiro, Onoda, Shinobu, Ohshima, Takeshi, Ikeda, Shoji, Sato, Hideo, Enobio, Eli Christopher Inocencio, Endoh, Tetsuo, Ohno, Hideo

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Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground von Hirose, Kazuyuki, Kobayashi, Daisuke, Ito, Taichi, Endoh, Tetsuo

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Delphi Method Consensus-Based Identification of Primary Trauma Care Skills Required for General Surgeons in Japan von Hirose, Kazuyuki, Murakami, Soichi, Kurashima, Yo, Sato, Nagato, Poudel, Saseem, Tanaka, Kimitaka, Matsui, Aya, Nakanishi, Yoshitsugu, Asano, Toshimichi, Noji, Takehiro, Ebihara, Yuma, Nakamura, Toru, Tsuchikawa, Takahiro, Shichinohe, Toshiaki, Okada, Kazufumi, Yokota, Isao, Hasegawa, Naoto, Hirano, Satoshi

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