Threshold and Characteristic LETs in SRAM SEU Cross-Section Curves von Kobayashi, Daisuke, Uematsu, Masashi, Hirose, Kazuyuki

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An SRAM SEU Cross Section Curve Physics Model von Kobayashi, Daisuke, Hirose, Kazuyuki, Sakamoto, Keita, Tsuchiya, Yuta, Okamoto, Shogo, Baba, Shunsuke, Shindou, Hiroyuki, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi

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Tolerance of Perovskite Solar Cell to High-Energy Particle Irradiations in Space Environment von Miyazawa, Yu, Ikegami, Masashi, Chen, Hsin-Wei, Ohshima, Takeshi, Imaizumi, Mitsuru, Hirose, Kazuyuki, Miyasaka, Tsutomu

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Proton Irradiation Tolerance of High-Efficiency Perovskite Absorbers for Space Applications von Kanaya, Shusaku, Kim, Gyu Min, Ikegami, Masashi, Miyasaka, Tsutomu, Suzuki, Kohtaku, Miyazawa, Yu, Toyota, Hiroyuki, Osonoe, Kanta, Yamamoto, Tomoyuki, Hirose, Kazuyuki

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Investigation of Buried-Well Potential Perturbation Effects on SEU in SOI DICE-Based Flip-Flop Under Proton Irradiation von Sakamoto, Keita, Baba, Shunsuke, Kobayashi, Daisuke, Okamoto, Shogo, Shindou, Hiroyuki, Kawasaki, Osamu, Makino, Takahiro, Mori, Yoshiharu, Matuura, Daisuke, Kusano, Masaki, Narita, Takanori, Ishii, Shigeru, Hirose, Kazuyuki

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Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method von Motoki, Keisuke, Miyazawa, Yu, Kobayashi, Daisuke, Ikegami, Masashi, Miyasaka, Tsutomu, Yamamoto, Tomoyuki, Hirose, Kazuyuki

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Characterization of stability of benchmark organic photovoltaic films after proton and electron bombardments von Barbé, Jérémy, Lee, Harrison K. H., Toyota, Hiroyuki, Hirose, Kazuyuki, Sato, Shin-ichiro, Ohshima, Takeshi, Heasman, Keith C., Tsoi, Wing C.

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A Methodology for Reconstructing DSET Pulses from Heavy-Ion Broad-Beam Measurements von Makino, Takahiro, Onoda, Shinobu, Ohshima, Takeshi, Kobayashi, Daisuke, Ikeda, Hirokazu, Hirose, Kazuyuki

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Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets von Kobayashi, Daisuke, Hirose, Kazuyuki, Ito, Taichi, Kakehashi, Yuya, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi, Matsuura, Daisuke, Narita, Takanori, Kato, Masahiro, Ishii, Shigeru, Masukawa, Kazunori

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Influence of Heavy Ion Irradiation on Perpendicular-Anisotropy CoFeB-MgO Magnetic Tunnel Junctions von Kobayashi, Daisuke, Kakehashi, Yuya, Hirose, Kazuyuki, Onoda, Shinobu, Makino, Takahiro, Ohshima, Takeshi, Ikeda, Shoji, Yamanouchi, Michihiko, Sato, Hideo, Enobio, Eli Christopher, Endoh, Tetsuo, Ohno, Hideo

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Laser Visualization of the Development of Long Line-Type Mutli-Cell Upsets in Back-Biased SOI SRAMs von Itsuji, Hiroaki, Kobayashi, Daisuke, Kawasaki, Osamu, Matsuura, Daisuke, Narita, Takanori, Kato, Masahiro, Ishii, Shigeru, Masukawa, Kazunori, Hirose, Kazuyuki

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Memory reliability of spintronic materials and devices for disaster-resilient computing against radiation-induced bit flips on the ground von Hirose, Kazuyuki, Kobayashi, Daisuke, Ito, Taichi, Endoh, Tetsuo

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Delphi Method Consensus-Based Identification of Primary Trauma Care Skills Required for General Surgeons in Japan von Hirose, Kazuyuki, Murakami, Soichi, Kurashima, Yo, Sato, Nagato, Poudel, Saseem, Tanaka, Kimitaka, Matsui, Aya, Nakanishi, Yoshitsugu, Asano, Toshimichi, Noji, Takehiro, Ebihara, Yuma, Nakamura, Toru, Tsuchikawa, Takahiro, Shichinohe, Toshiaki, Okada, Kazufumi, Yokota, Isao, Hasegawa, Naoto, Hirano, Satoshi

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Paraneoplastic Extralimbic Encephalitis Associated with Thymoma: A Case Report von Aragaki, Masato, Iimura, Yasuaki, Teramoto, Kenichi, Sato, Nagato, Hirose, Kazuyuki, Hasegawa, Naoto

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Analysis of Local Environment of Fe Ions in Hexagonal BaTiO3 von Chikada, Shunsuke, Hirose, Kazuyuki, Yamamoto, Tomoyuki

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Learning Multiple Band-Pass Filters for Sleep Stage Estimation: Towards Care Support for Aged Persons von TAKADAMA, Keiki, HIROSE, Kazuyuki, MATSUSHIMA, Hiroyasu, HATTORI, Kiyohiko, NAKAJIMA, Nobuo

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Waveform Observation of Digital Single-Event Transients Employing Monitoring >Transistor Technique von Kobayashi, D., Hirose, K., Yanagawa, Y., Ikeda, H., Saito, H., Ferlet-Cavrois, V., McMorrow, D., Gaillardin, M., Paillet, P., Arai, Y., Ohno, M.

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Analytical expression for temporal width characterization of radiation-induced pulse noises in SOI CMOS logic gates von Kobayashi, D., Makino, T., Hirose, K.

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Schottky barrier heights, carrier density, and negative electron affinity of hydrogen-terminated diamond von Tsugawa, K., Noda, H., Hirose, K., Kawarada, H.

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Heavy Ion Generated Current Leading to Long Line-type Soft Errors in Thin BOX SOI SRAMS von Chung, ChinHan, Kobayashi, Daisuke, Hirose, Kazuyuki

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