Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing von Hirano, Izumi, Nakasaki, Yasushi, Fukatsu, Shigeto, Goto, Masakazu, Nagatomo, Koji, Inumiya, Seiji, Sekine, Katsuyuki, Mitani, Yuichiro, Yamabe, Kikuo

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Atomic-scale theory on current-assisted thermochemical degradation mode and its field acceleration via charge trapping of O vacancy in HfSiO4 von NAKASAKI, Yasushi, HIRANO, Izumi, KATO, Koichi, MITANI, Yuichiro

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Characteristics of Defect Generation and Breakdown in SiO2 for Polycrystalline Silicon Channel Field-Effect Transistor von Hirano, Izumi, Saitoh, Masumi, Numata, Toshinori, Mitani, Yuichiro

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An Archival Approach Applying the 3Cs-Concept to Animation Studies:Research on ONBU OBAKE as a Case Study von HIRANO, Izumi

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Method of Decoupling the Bias Temperature Instability Component from Hot Carrier Degradation in Ultrathin High-$k$ Metal--Oxide--Semiconductor Field-Effect Transistors von Masada, Akiko, Hirano, Izumi, Fukatsu, Shigeto, Mitani, Yuichiro

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Tomada de decisão nas organizações: o que muda com a Inteligência Artificial? von Yu, Abraham Sin Oih, Nardy, André, Hirano, Heloiza Izumi, Oliveira, Jefferson Freitas Amancio de, Ribeiro, Nathan de Vasconcelos, Grando, Nei

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Effects of Electron Current and Hole Current on Dielectric Breakdown in HfSiON Gate Stacks von Hirano, Izumi, Yamaguchi, Takeshi, Nakasaki, Yasushi, Iijima, Ryosuke, Sekine, Katsuyuki, Takayanagi, Mariko, Eguchi, Kazuhiro, Mitani, Yuichiro

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Effects of Electron Current and Hole Current on Dielectric Breakdown in HfSiON Gate Stacks von Hirano, Izumi, Yamaguchi, Takeshi, Nakasaki, Yasushi, Iijima, Ryosuke, Sekine, Katsuyuki, Takayanagi, Mariko, Eguchi, Kazuhiro, Mitani, Yuichiro

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Reort on the Talk Event in the 22nd General Meeting von HIRANO, Izumi

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Impact of metal gate electrode on Weibull distribution of TDDB in HfSiON gate dielectrics von Hirano, I., Nakasaki, Y., Fukatsu, S., Masada, A., Mitani, Y., Goto, M., Nagatomo, K., Inumiya, S., Sekine, K.

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"Minikomi" as research resource : The case of the Research Center for Cooperative Civil Societies, Rikkyo University(<Special feature>"Free paper" in Japan) von Hirano, Izumi

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A relação da tomada de decisão com a inteligência competitiva e com a gestão do conhecimento, na produção acadêmica a partir do ano 2000 von Heloiza Izumi Hirano, Paletta, Francisco Carlos

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Atomic-scale theory on degradation of HfSiON gate stacks by atomic hydrogen accompanied by its interaction with oxygen vacancy and substitutional nitrogen von Nakasaki, Yasushi, Hirano, Izumi, Kato, Koichi, Mitani, Yuuichiro

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Erratum to “Atomic-scale theory on degradation of HfSiON gate stacks by atomic hydrogen accompanied by its interaction with oxygen vacancy and substitutional nitrogen” [Microelectr... von Nakasaki, Yasushi, Hirano, Izumi, Kato, Koichi, Mitani, Yuuichiro

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'Zine' as a research resource : The case of the Research Center for Cooperative Civil Societies, Rikkyo University von Hirano, Izumi

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Characteristics of Defect Generation and Breakdown in SiO 2 for Polycrystalline Silicon Channel Field-Effect Transistor von Hirano, Izumi, Saitoh, Masumi, Numata, Toshinori, Mitani, Yuichiro

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Characteristics of Defect Generation and Breakdown in SiO 2 for Polycrystalline Silicon Channel Field-Effect Transistor von Hirano, Izumi, Saitoh, Masumi, Numata, Toshinori, Mitani, Yuichiro

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11. A relação da tomada de decisão com a inteligência competitiva e com a gestão do conhecimento von Hirano, Heloiza Izumi, Paletta, Francisco Carlos, Côrtes, Pedro Luiz

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Donʼt Be Afraid of the Digital: Notes on the Two Initiatives Related to Digital Preservation von HIRANO, Izumi

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Atomic-scale theory on current-assisted thermochemical degradation mode and its field acceleration via charge trapping of O vacancy in HfSiO@@d4@ von Nakasaki, Yasushi, Hirano, Izumi, Kato, Koichi, Mitani, Yuichiro

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