KRISTALLIN POLYIMID ENTHALTENDE HARZZUSAMMENSETZUNG von TOYOHARA, KIYOTSUNA, OZAKI, DAISUKE, ISHIWATA, TOYOAKI, SADANOBU, JIRO, HINODEO

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METHOD AND APPARATUS FOR SURFACE ANALYSIS von SHICHI, HIROYASU E404, HITACHI-OWADA APT, KURE, TOKUO 993-45, OGUNO HINODEO, TODOKORO, HIDEO 2196-313, HIRAI HINODEO, NINOMIYA, KEN A304, SHIKI-NO-OKA, MITSUI, YASUSHIRO 4-14-29, NISHIFUO, KURODA, KATSUHIRO 2-15-11, NANYODAI

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Method for measuring distribution of zero dispersion wavelength in optical fiber and apparatus therefor von SARUWATARI, MASATOSHI, 1-38-15, KOYABE, SUZUKI, KEN-ICHI, C-312, 9-2-12, SUGITA, IWATSUKI, KATSUMI, 203, 4-27-12, YOKODAI, NISHI, SHIGENDO, 108, 3-20, HINODEO

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Method for measuring distribution of zero dispersion wavelength in optical fiber and apparatus therefor von SARUWATARI, MASATOSHI, 1-38-15, KOYABE, SUZUKI, KEN-ICHI, C-312, 9-2-12, SUGITA, IWATSUKI, KATSUMI, 203, 4-27-12, YOKODAI, NISHI, SHIGENDO, 108, 3-20, HINODEO

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Method for measuring distribution of zero dispersion wavelength in optical fiber and apparatus therefor von SARUWATARI, MASATOSHI, 1-38-15, KOYABE, SUZUKI, KEN-ICHI, C-312, 9-2-12, SUGITA, IWATSUKI, KATSUMI, 203, 4-27-12, YOKODAI, NISHI, SHIGENDO, 108, 3-20, HINODEO

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APPARATUS FOR MEASURING WAVELENGTH OF LIGHT BY HIGH PRECISION DETECTION OF INTERFERENCE FRINGE von IMAI, TAKAMASA, 2-1-3-2-303, HAYASHI, TSUKAMOTO, TAKESHI, C-105, 882-1, TSURUMAKI, TAMURA, YOUICHI, B-201, YATOH HAITSU, ICHIHASHI, YASUTAKA, 3-20-1, HINODEO, GOTO, HIROSHI, 661-1-401, ISHIDA

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METHOD AND APPARATUS FOR SURFACE ANALYSIS von KURODA KATSUHIRO, KURE TOKUO - OGUNO HINODEO, MITSUI YASUSHIRO, SHICHI HIROYASU E HITACHI-OWAD, TODOKORO HIDEO - HIRAI HINODE, NINOMIYA KEN A SHIKI-NO-OKA

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APPARATUS FOR MEASURING WAVELENGTH OF LIGHT BY HIGH PRECISION DETECTION OF INTERFERENCE FRINGE von IMAI, TAKAMASA, 2-1-3-2-303, HAYASHI, TSUKAMOTO, TAKESHI, C-105, 882-1, TSURUMAKI, TAMURA, YOUICHI, B-201, YATOH HAITSU, ICHIHASHI, YASUTAKA, 3-20-1, HINODEO, GOTO, HIROSHI, 661-1-401, ISHIDA

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APPARATUS FOR MEASURING WAVELENGTH OF LIGHT BY HIGH PRECISION DETECTION OF INTERFERENCE FRINGE von IMAI, TAKAMASA, 2-1-3-2-303, HAYASHI, TSUKAMOTO, TAKESHI, C-105, 882-1, TSURUMAKI, TAMURA, YOUICHI, B-201, YATOH HAITSU, ICHIHASHI, YASUTAKA, 3-20-1, HINODEO, GOTO, HIROSHI, 661-1-401, ISHIDA

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GERÄT ZUR MESSUNG DER LICHTWELLENLÄNGE DURCH HOCHAUFLÖSENDEN NACHWEIS VON INTERFERENZ STREIFEN von GOTO, HIROSHI, 661-1-401, ISHIDA, KANAGAWA-KEN 259-11, JP, TAMURA, YOUICHI, B-201, YATOH HAITSU, ATSUGI-SHI, KANAGAWA-KEN 243, JP, TSUKAMOTO, TAKESHI, C-105, 882-1, TSURUMAKI, KANAGAWA-KEN 257, JP, IMAI, TAKAMASA, 2-1-3-2-303, HAYASHI, KANAGAWA-KEN 238-03, JP, ICHIHASHI, YASUTAKA, 3-20-1, HINODEO, KANAGAWA-KEN 238, JP

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